Taiki Uemura Last updated: 13/05/21 16:50
Conferences
Taiki Uemura
Technical Committee on Integrated Circuits and Devices Dec 2012
Taiki Uemura
Soft Error workshop in Japan Aug 2012
Taiki Uemura
Soft Error workshop in Japan Sep 2011
Taiki Uemura
RCNP workshop Jun 2011 RCNP
Misc
R. Kan, T. Tanaka, G. Sugizaki, R. Nishiyama, S. Sakabayashi, Y. Koyanagi, R. Iwatsuki, K. Hayasaka, T. Uemura, G. Ito, Y. Ozeki, H. Adachi, K. Furuya, T. Motokurumada
2013
Lifetime evaluation on AC stress in High-K / Metal-Gate with Using Dual-Pulsed-Test-System (DPTS)
H. Mori, Y. Ikeda, T. Kato, T. Uemura and H. Matsuyama
Proc. International Conference. on Solid State Devices and Materials 122-123 Sep 2012 [Refereed]
Investigation of BTI degradation in LDMOS transistors
Y. Ikeda, H. Mori, T. Kato, T. Uemura, M. Yoshida, M. Onoda and H. Matsuyama
Proc. International Conference. on Solid State Devices and Materials 454-455 Sep 2012 [Refereed]
Radiation-Induced Parasitic Bipolar Effect in PMOS with Embedded SiGe
T. Kato, T. Uemura, H. Mori, Y. Ikeda, K. Suzuki, S. Satoh and H. Matsuyama
Proc. International Conference. on Solid State Devices and Materials 847-848 Sep 2012 [Refereed]
T. Uemura, R. Tanabe, H. Matsuyama
Proc. IEEE International. Reliability Physics Symp. 5B.4.1-5B.4.6 Apr 2012 [Refereed]
S.-i. Abe, Y. Watanabe, N. Shibano, N. Sano, H. Furuta, M. Tsutsui, T. Uemura, T. Arakawa
Proc. IEEE International. Reliability Physics Symp. SE.3.1-SE.3.6 2012 [Refereed]
H. Nakamura, T. Uemura, K. Takeuchi, T. Fukuda, S. Kumashiro, T. Mogami
Proc. IEEE International. Reliability Physics Symp. 3C.3.1-3C.3.7 2012 [Refereed]
S. Abe, Y. Watanabe, N. Shibano, N. Sano, H. Furuta, M. Tsutsui, T. Uemura, T. Arakawa
12th Radiation and Its Effects on Components and Systems (RADECS) 390-395 2011 [Refereed]
Taiki Uemura, Tsunehisa Sakoda, Hideya Matsuyama
Proc. IEEE International Conference on IC Design and Technology 1-4 2011 [Refereed]
Taiki Uemura, Takashi Kato, Hideya Matsuyama, Keiji Takahisa, Mitsuhiro Fukuda, Kichiji Hatanaka
Proc. IEEE International On-Line Testing Symposium 7-12 2011 [Refereed]
TANAKA Katsuhiko, NAKAMURA Hideyuki, UEMURA Taiki, TAKEUCHI Kan, FUKUDA Toshikazu, KUMASHIRO Shigetaka, MOGAMI Tohru
Technical report of IEICE. SDM 110(274) 47-52 Nov 2010
Taiki Uemura
Proceedings of the Society Conference of IEICE 2010 "SS-32"-"SS-33" Aug 2010 [Invited]
Taiki Uemura, Yoshiharu Tosaka, Hideya Matsuyama, Chihiro J. Uchibori, Keiji Takahisa, Mitsuhiro Fukuda, Kichiji Hatanaka
Proc. IEEE International. Reliability Physics Symp. 218-223 2010 [Refereed]
Hideyuki Nakamura, Katsuhiko Tanaka, Taiki Uemura, Kan Takeuchi, Toshikazu Fukuda and Shigetaka Kumashiro
Proc. IEEE International. Reliability Physics Symp. 694-697 2010 [Refereed]
Simulation of Cosmic-ray Neutron Induced Soft Errors Using PHITS and HyENEXSS
Shinichiro Abe, Yukinobu Watanabe, Nozomi Shibano, Nobuyuki Sano, Takahiko Arakawa, Hiroshi Furuta, Masafumi Tsutsui and Taiki Uemura
Proc. International Radiation Effects on Semiconductor Devices for Space Applications 2010 [Refereed]
Katsuhiko Tanaka, Hideyuki Nakamura, Taiki Uemura,
Kan Takeuchi, Toshikazu Fukuda, and Shigetaka Kumashiro
Proc. IEEE Simulation of Semiconductor Processes and Devices 1-4 2009 [Refereed]
Taiki Uemura, Ryo Tanabe, Yoshiharu Tosaka, Shigeo Satoh
Proc. IEEE International On-Line Testing Symposium 117-122 2008 [Refereed]
Robust Flip-Flop against Soft Errors for Combinational and Sequential Logic Circuits
Taiki Uemura, Yoshiharu Tosaka, Hideya Matsuyama, Keiji Takahisa, Kichiji Hatanaka
Proc. International Conference. on Solid State Devices and Materials 88-89 2008 [Refereed]
Yoshiharu Tosaka, Ryozo Takasu, Taiki Uemura, Hideo Ehara, Hideya Matsuyama, Shigeo Satoh, Atsushi Kawai and Masahiko Hayashi
Proc. IEEE International Reliability Physics Symposium 727-728 2008 [Refereed]
Neutron-Accelerated Test of Soft Error in Logic Element and System
Yoshiharu Tosaka, Taiki Uemura, Hisa Ando, Hideya Matsuyama, Ken Shono, Keiji Takahisa, Mitsuhiro Fukuda and Kichiji Hatanaka
Proc. International Workshop on Radiation Effects on Semiconductor Devices for Space Radiation 85-90 2008 [Refereed]
Novel Soft Error Hardened Latches and Flip-Flop
Taiki Uemura, Ryo Tanabe, Yoshiharu Tosaka, Shigeo Satoh
Proc. International Conference. on Solid State Devices and Materials 84-85 2007 [Refereed]
Scaling Trends and Mitigation Techniques for Soft Errors in Flip-Flops
Taiki Uemura, Yoshiharu Tosaka, Shigeo Satoh, Keiji Takahisa, Kichiji Hatanaka
Proc. International Conference. on Solid State Devices and Materials 284-285 2006 [Refereed]
Uemura Taiki, Tosaka Yoshiharu, Ashizawa Yoshio, Oka Hideki, Satoh Shigeo
Technical report of IEICE. ICD 105(2) 37-42 Apr 2005
TOSAKA Yoshiharu, EHARA Hideo, IGETA Mitsuaki, UEMURA Taiki, OKA Hideki, MATSUOKA Nobuyuki, HATANAKA Kichiji
Technical report of IEICE. SDM 104(577) 47-50 Jan 2005
Neutron-induced Soft-Error Simulation Technology for Logic Circuits
Taiki Uemura, Yoshiharu Tosaka, Shigeo Satoh
Proc. International Conference. on Solid State Devices and Materials 942-943 2005 [Refereed]
Technology Trend of Soft Errors based on Accurate Estimation Method
Yoshiharu Tosaka, Ryozo Takasu, Hideo Ehara, Taiki Uemura, Hideki Oka, Shigeo Satoh, N. Matsuoka, and Kichiji Hatanaka
Proc. International Conference. on Solid State Devices and Materials 442-443 2005 [Refereed]
Yoshiharu Tosaka, Hideo Ehara, Mitsuaki Igeta, Taiki Uemura, Hideki Oka, N. Matsuoka, and Kichiji Hatanaka
Proc. IEEE International Electron Device Meeting 941-944 2004 [Refereed]
Toda Masayuki, Uemura Taiki, Takahashi Takumi, Nawano Masahisa, Umeda Masaru, Kusuhara Masaki, Yamoto Hisayoshi, Fukagawa Mituru, Shoji Masafumi, Akuto Kazuya
Technical report of IEICE. SDM 102(732) 75-80 Mar 2003
Papers
R. Harada, S. Abe, H. Fuketa, T. Uemura, M. Hashimoto, Y. Watanabe
IEEE Transactions on Nuclear Science 59(6) 2791-2795 2013 [Refereed]
Takashi Kato, Taiki Uemura, Hiroko Mori, Yoshihiro Ikeda, Kaina Suzuki, Shigeo Satoh, and Hideya Matsuyama
Japanese Jounal of Applied Physics 52 04CC15 2013 [Refereed]
S. Abe, Y. Watanabe, N. Shibano, N. Sano, H. Furuta, M. Tsutsui, T. Uemura, T. Arakawa
Nuclear Science, IEEE Transactions on 99 1-6 2012 [Refereed]
Taiki Uemura, Yoshiharu Tosaka, Hideya Matsuyama, Keiji Takahisa, Kichiji Hatanaka
Japanese Journal of Applied Physics 48 2009 [Refereed]
Taiki Uemura, Ryo Tanabe, Yoshiharu Tosaka, Shigeo Satoh
Japanese Journal of Applied Physics 47 2736-2741 2008 [Refereed]
Yoshiharu. Tosaka, Ryozo. Takasu, Hideo Ehara, Taiki. Uemura, Hideki Oka, Shigeo Satoh, N. Matsuoka, and Kichiji Hatanaka
Japanese Journal of Applied Physics 45 3185-3188 2006 [Refereed]
Taiki Uemura, Yoshiharu Tosaka, Shigeo Satoh
Japanese Journal of Applied Physics 45 3256-3259 2006 [Refereed]
Committee Career
2012
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Today
IEEE International Reliability Physics Symposium (IRPS) Soft Error Committee
2011
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2011
IEEE International Conference on IC Design and Technology (ICICDT) Program Committee
2010
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2010
Conference on Design, Automation & Test in Europe (DATE) Program Committee
2008
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Today
IEEE International On-Line Testing Symposium (IOLTS) Program Comittee
