Papers

Peer-reviewed International journal

Nov, 1998

Thin Film Magnetic Head Wafer Inspection Technique using Geometrical Feature-Based Image Comparison

Proceedings of IAPR Workshop on Machine Vision Applications (MVA'98)

Atsushi Shimoda
Hisafumi Iwata
Yukihiro Shibata
Hidehiro Ikeda

First page: 531
Last page: 534
Language: English
Publishing type: Research paper (international conference proceedings)

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