論文

査読有り 筆頭著者
2012年11月

A novel actinomycete derived from wheat heads degrades deoxynivalenol in the grain of wheat and barley affected by Fusarium head blight

APPLIED MICROBIOLOGY AND BIOTECHNOLOGY
  • Michihiro Ito
  • ,
  • Ikuo Sato
  • ,
  • Motoo Koitabashi
  • ,
  • Shigenobu Yoshida
  • ,
  • Machiko Imai
  • ,
  • Seiya Tsushima

96
4
開始ページ
1059
終了ページ
1070
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1007/s00253-012-3922-6
出版者・発行元
SPRINGER

Deoxynivalenol (DON) is a hazardous and globally prevalent mycotoxin in cereals. It commonly accumulates in the grain of wheat, barley and other small grain cereals affected by Fusarium head blight (caused by several Fusarium species). The concept of reducing DON in naturally contaminated grain of wheat or barley using a DON-degrading bacterium is promising but has not been accomplished. In this study, we isolated a novel DON-utilising actinomycete, Marmoricola sp. strain MIM116, from wheat heads through a novel isolation procedure including an in situ plant enrichment step. Strain MIM116 had background degradation activity, and the activity was enhanced twofold by the consumption of DON. Among Tween 20, Triton X-100 and Tween 80, we selected Tween 80 as a spreading agent of strain MIM116 because it promoted DON degradation and the growth of strain MIM116 in the presence of DON. The inoculation of MIM116 cell suspension plus 0.01% Tween 80 into 1,000 harvested kernels of wheat and barley resulted in a DON decrease from approximately 3 mg kg(-1) to less than 1 mg kg(-1) of dry kernels, even when cells had only basal levels of DON-degrading activity. To the best of our knowledge, this is the first report that describes (1) the isolation of a DON-degrading bacterium from wheat heads, (2) the effects of surfactants on the biodegradation of DON and (3) the decrease of DON levels in naturally contaminated wheat and barley grain using a DON-degrading bacterium.

リンク情報
DOI
https://doi.org/10.1007/s00253-012-3922-6
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000310222300021&DestApp=WOS_CPL
ID情報
  • DOI : 10.1007/s00253-012-3922-6
  • ISSN : 0175-7598
  • Web of Science ID : WOS:000310222300021

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