2001年10月
Read/write characteristics of focused-ion-beam-etched heads for perpendicular magnetic recording media
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
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- ,
- ,
- ,
- 巻
- 235
- 号
- 1-3
- 開始ページ
- 375
- 終了ページ
- 381
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.1016/S0304-8853(01)00384-5
- 出版者・発行元
- ELSEVIER SCIENCE BV
The read/write characteristics for perpendicular magnetic recording media of focused-ion-beam (FIB)-etched recording heads were investigated. It was found that the trailing edge of an FIB-etched head produces a higher gradient in the magnetic field perpendicular to the medium than a head which has not been etched. The signal-to-noise ratio of the medium increased with the FIB-etched write gap. A high-Bs and thin pole increased the magnetic field's gradient in the perpendicular direction, resulting in excellent read/write characteristics. (C) 2001 Elsevier Science B.V. All rights reserved.
- リンク情報
- ID情報
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- DOI : 10.1016/S0304-8853(01)00384-5
- ISSN : 0304-8853
- ORCIDのPut Code : 104530923
- Web of Science ID : WOS:000171533300065