論文

査読有り
2001年10月

Read/write characteristics of focused-ion-beam-etched heads for perpendicular magnetic recording media

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
  • S Tsuboi
  • ,
  • H Matsutera
  • ,
  • T Ishi
  • ,
  • N Ishiwata
  • ,
  • K Ohashi

235
1-3
開始ページ
375
終了ページ
381
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1016/S0304-8853(01)00384-5
出版者・発行元
ELSEVIER SCIENCE BV

The read/write characteristics for perpendicular magnetic recording media of focused-ion-beam (FIB)-etched recording heads were investigated. It was found that the trailing edge of an FIB-etched head produces a higher gradient in the magnetic field perpendicular to the medium than a head which has not been etched. The signal-to-noise ratio of the medium increased with the FIB-etched write gap. A high-Bs and thin pole increased the magnetic field's gradient in the perpendicular direction, resulting in excellent read/write characteristics. (C) 2001 Elsevier Science B.V. All rights reserved.

リンク情報
DOI
https://doi.org/10.1016/S0304-8853(01)00384-5
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000171533300065&DestApp=WOS_CPL
ID情報
  • DOI : 10.1016/S0304-8853(01)00384-5
  • ISSN : 0304-8853
  • ORCIDのPut Code : 104530923
  • Web of Science ID : WOS:000171533300065

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