論文

査読有り
2014年4月

Delamination crack initiation from copper/silicon nitride interface edge with nanoscale singular stress field

ENGINEERING FRACTURE MECHANICS
  • Emi Kawai
  • ,
  • Kazunori Sanada
  • ,
  • Takashi Sumigawa
  • ,
  • Takayuki Kitamura

120
開始ページ
60
終了ページ
66
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1016/j.engfracmech.2014.02.001
出版者・発行元
PERGAMON-ELSEVIER SCIENCE LTD

In order to investigate delamination crack initiation from an interfacial edge in nanoscale component with the singular stress field, we conduct mechanical experiments using four kinds of cantilever specimens with the nanoscale singular stress field at the copper/silicon nitride interface. The results reveal that regardless of the specimen dimensions, the critical magnitude of the plastic stress intensity parameter, K-interface (edge (c)), is constant (112 MPa m(0.179)) within the singular stress field range of approximately 25 nm. This indicates that in the nano-sized component, a delamination crack initiation is dominated by a nanoscale singular stress field near the interface edge. (C) 2014 Elsevier Ltd. All rights reserved.

リンク情報
DOI
https://doi.org/10.1016/j.engfracmech.2014.02.001
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000335611200005&DestApp=WOS_CPL
URL
http://repository.kulib.kyoto-u.ac.jp/dspace/handle/2433/187746
ID情報
  • DOI : 10.1016/j.engfracmech.2014.02.001
  • ISSN : 0013-7944
  • eISSN : 1873-7315
  • Web of Science ID : WOS:000335611200005

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