2020年8月18日
Hidden thin-film phase of dinaphthothienothiophene revealed by high-resolution X-ray diffraction
Applied Physics Express
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- 巻
- 13
- 号
- 9
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.35848/1882-0786/abb061
- 出版者・発行元
- IOP Publishing
Dinaphthothienothiophene (DNTT) has attracted considerable attention as a next-generation material for organic thin-film transistors, replacing the conventional basic material of pentacene. Although the performance of DNTT devices is higher than that of pentacene, and has been reported numerously, a comprehensive understanding of thin-film growth is lacking. In fact, thin-film structures have long been believed to be identical to single-crystal structures. In the present study, the thickness-dependent structural evolution is revealed by means of high-resolution X-ray diffraction. This technique apparently discriminates the thin-film structure from the conventionally known bulk structure. Thus, we have revealed the thin-film phase of DNTT for the first time.
- リンク情報
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- DOI
- https://doi.org/10.35848/1882-0786/abb061
- Web of Science
- https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000565725800001&DestApp=WOS_CPL
- URL
- https://iopscience.iop.org/article/10.35848/1882-0786/abb061
- URL
- https://iopscience.iop.org/article/10.35848/1882-0786/abb061/pdf
- ID情報
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- DOI : 10.35848/1882-0786/abb061
- ISSN : 1882-0778
- eISSN : 1882-0786
- Web of Science ID : WOS:000565725800001