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Peer-reviewed Corresponding author
Dec 1, 2017

A necessary and sufficient condition of supply and threshold voltages in CMOS circuits for minimum energy point operation

IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
  • Jun Shiomi
  • ,
  • Tohru Ishihara
  • ,
  • Hidetoshi Onodera

Volume
E100A
Number
12
First page
2764
Last page
2775
Language
English
Publishing type
Research paper (international conference proceedings)
DOI
10.1587/transfun.E100.A.2764
Publisher
Institute of Electronics, Information and Communication, Engineers, IEICE

Scaling supply voltage (VDD) and threshold voltage (Vth) dynamically has a strong impact on energy efficiency of CMOS LSI circuits. Techniques for optimizing VDD and Vth simultaneously under dynamic workloads are thus widely investigated over the past 15 years. In this paper, we refer to the optimum pair of VDD and Vth, which minimizes the energy consumption of a circuit under a specific performance constraint, as a minimum energy point (MEP). Based on the simple transregional models of a CMOS circuit, this paper derives a simple necessary and sufficient condition for the MEP operation. The simple condition helps find the MEP of CMOS circuits. Measurement results using standard-cell based memories (SCMs) fabricated in a 65-nm process technology also validate the condition derived in this paper.

Link information
DOI
https://doi.org/10.1587/transfun.E100.A.2764
DBLP
https://dblp.uni-trier.de/rec/journals/ieicet/ShiomiIO17
URL
http://search.ieice.org/bin/summary.php?id=e100-a_12_2764
URL
https://dblp.uni-trier.de/db/journals/ieicet/ieicet100a.html#ShiomiIO17
ID information
  • DOI : 10.1587/transfun.E100.A.2764
  • ISSN : 1745-1337
  • ISSN : 0916-8508
  • DBLP ID : journals/ieicet/ShiomiIO17
  • SCOPUS ID : 85038211160

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