Papers

Peer-reviewed
Sep, 2013

A standard cell optimization method for near-threshold voltage operations

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
  • Masahiro Kondo
  • ,
  • Shinichi Nishizawa
  • ,
  • Tohru Ishihara
  • ,
  • Hidetoshi Onodera

Volume
7606
Number
First page
32
Last page
41
Language
English
Publishing type
Research paper (international conference proceedings)
DOI
10.1007/978-3-642-36157-9_4
Publisher
Springer

Near-threshold voltage operation is a well-known solution for drastically improving the energy efficiency of microprocessors fabricated with the latest process technologies. However, it is not well studied how the optimal gate size of standard cells changes when the supply voltage of the microprocessors gets closer to the threshold voltage. This paper first shows an experimental observation that the optimal gate size for nearthreshold voltage which is 0.6V in this work is far from the optimal gate size for the nominal supply voltage which is 1.2V in our target process technology. Based on this fact, the paper next presents our cell optimization flow which finds the optimal gate sizes of individual standard cells operating at the near-threshold voltage. The experimental results show that, when operating at the 0.6V condition, the energy consumptions of several benchmark circuits synthesized with our standard cells optimized for the 0.6V condition can be reduced by 31% at the best case and by 23% on average compared with those of the same circuits synthesized with the cells optimized for the nominal supply voltage. © Springer-Verlag Berlin Heidelberg 2013.

Link information
DOI
https://doi.org/10.1007/978-3-642-36157-9_4
DBLP
https://dblp.uni-trier.de/rec/conf/patmos/KondoNIO12
J-GLOBAL
https://jglobal.jst.go.jp/en/detail?JGLOBAL_ID=201302254242175111
URL
https://dblp.uni-trier.de/rec/conf/patmos/2012
URL
https://dblp.uni-trier.de/db/conf/patmos/patmos2012.html#KondoNIO12
ID information
  • DOI : 10.1007/978-3-642-36157-9_4
  • ISSN : 0302-9743
  • ISSN : 1611-3349
  • ISBN : 9783642361562
  • ISBN : 9783642361579
  • DBLP ID : conf/patmos/KondoNIO12
  • J-Global ID : 201302254242175111
  • SCOPUS ID : 84893418277

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