田中 亮平

Sample Preparation and Experimental Conditions for XRF and XRD : Fundamental parameter method for quantitative analysis using ED-XRF 

Th 59th Denver X-ray conference 2019年8月5日  招待有り

Polarization properties of X-rays and Their Applications to X-ray Analysis 

14th International Symposium on Radiation Physics 2018年10月7日  招待有り

3D-printed Spectrometers and Their Applications 

5th International conference on X-ray Analysis 2018年9月12日  招待有り