2013年
Dark current and white blemish in image sensors
2013 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2013
- 開始ページ
- 156
- 終了ページ
- 159
- 記述言語
- 英語
- 掲載種別
- 研究論文（国際会議プロシーディングス）
- DOI
- 10.1109/VLSI-TSA.2013.6545639
It has been always biggest issues to reduce dark current and white blemish in image sensor development. For this purpose, various analysis methods and gettering methods have been developed. © 2013 IEEE.
- ID情報
-
- DOI : 10.1109/VLSI-TSA.2013.6545639
- SCOPUS ID : 84881185840