論文

査読有り
2000年9月

Dynamic range improvement by narrow-channel effect suppression and smear reduction technologies in small pixel IT-CCD image sensors

IEEE TRANSACTIONS ON ELECTRON DEVICES
  • A Tanabe
  • Y Kudoh
  • Y Kawakami
  • K Masubuchi
  • S Kawai
  • T Yamada
  • M Morimoto
  • K Arai
  • K Hatano
  • M Furumiya
  • Y Nakashiba
  • N Mutoh
  • K Orihara
  • N Teranishi
  • 全て表示

47
9
開始ページ
1700
終了ページ
1706
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1109/16.861580
出版者・発行元
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Technologies for narrow-channel effect suppression in photodiodes (PDs) and vertical CCDs (V-CCDs) and for smear reduction in PDs have been developed in order to improve dynamic range in small pixel interline-transfer CCD (IT-CCD) image sensors, The new technologies have been applied to a progressive-scan IT-CCD image sensor with 5 mu m square pixels and have I) increased the charge handling capability of its V-CCDs to 4500 electrons/V; 2) improved its smear value to -95 dB; and 3) increased the saturation charge of its PDs to 2.3 x 10(4) electrons.

リンク情報
DOI
https://doi.org/10.1109/16.861580
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000088815100003&DestApp=WOS_CPL
ID情報
  • DOI : 10.1109/16.861580
  • ISSN : 0018-9383
  • Web of Science ID : WOS:000088815100003

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