2000年9月
Dynamic range improvement by narrow-channel effect suppression and smear reduction technologies in small pixel IT-CCD image sensors
IEEE TRANSACTIONS ON ELECTRON DEVICES
- 巻
- 47
- 号
- 9
- 開始ページ
- 1700
- 終了ページ
- 1706
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.1109/16.861580
- 出版者・発行元
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Technologies for narrow-channel effect suppression in photodiodes (PDs) and vertical CCDs (V-CCDs) and for smear reduction in PDs have been developed in order to improve dynamic range in small pixel interline-transfer CCD (IT-CCD) image sensors, The new technologies have been applied to a progressive-scan IT-CCD image sensor with 5 mu m square pixels and have I) increased the charge handling capability of its V-CCDs to 4500 electrons/V; 2) improved its smear value to -95 dB; and 3) increased the saturation charge of its PDs to 2.3 x 10(4) electrons.
- リンク情報
- ID情報
-
- DOI : 10.1109/16.861580
- ISSN : 0018-9383
- Web of Science ID : WOS:000088815100003