基本情報

所属
広島大学
学位
修士(工学)(2004年3月 広島大学)
博士(学術)(2006年9月 広島大学)

研究者番号
20796536
J-GLOBAL ID
201801004351494089
researchmap会員ID
7000028256

My research is focused on the development of “compact models” for semiconductor devices such as MOSFET, high-voltage MOS (HVMOS), super-junction (SJMOS) and IGBT. The compact models are used in simulating circuits to predict circuit performance and to aid in circuit design optimization. To support the development of compact models, my work also involves device simulations using TCAD software to determine the physical phenomena behind the operation of the devices.On-wafer measurements of the device DC and AC characteristics are also performed. Our group in HiSIM Research Center has developed standard compact models for MOSFET, HVMOS, SOI and SOTB devices, which are used in the electronics industry. We are also developing models for high-voltage and high-power devices employing SiC material.

論文

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講演・口頭発表等

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