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Peer-reviewed Corresponding author
Jan 28, 2021

Accumulated Charge Measurement: Control of the Interfacial Depletion Layer by Offset Voltage and Estimation of Band Gap and Electron Injection Barrier

The Journal of Physical Chemistry C
  • Sunao Shimomoto
  • ,
  • Tomofumi Kadoya
  • ,
  • Toshiaki Tanimura
  • ,
  • Kazusuke Maenaka
  • ,
  • Tokuji Yokomatsu
  • ,
  • Takeshi Komino
  • ,
  • Hiroyuki Tajima

Volume
125
Number
3
First page
1990
Last page
1998
Language
Publishing type
Research paper (scientific journal)
DOI
10.1021/acs.jpcc.0c04974
Publisher
American Chemical Society (ACS)

This study investigates the charge injection barrier at the phthalocyanine (H2Pc)/Pd using accumulated charge measurement (ACM). Because the hole injection barrier is relatively small, the voltage oscillation method in ACM is achieved at the highest occupied molecular orbital/Pd interface, and the hole injection barrier was determined to be 0.26 eV. A negative offset voltage was applied to determine the electron injection barrier at the lowest unoccupied molecular orbital (LUMO)/Pd interface. However, when the electron injection barrier was significantly large, the charge-injected thermal equilibrium state (CITES) could not be achieved at the interface, and an accurate injection barrier could not be determined. Surprisingly, by applying a positive offset voltage, a CITES of electrons was obtained at the LUMO/Pd interface, and the band gap was determined to be 2.75 eV. Furthermore, the electron injection barrier was found to be 2.49 eV. By applying a positive offset voltage, band bending occurred at the H2Pc/Pd interface, thereby reducing the depletion layer in the LUMO and enabling the determination of the band gap and electron injection barrier.

Link information
DOI
https://doi.org/10.1021/acs.jpcc.0c04974
URL
https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.0c04974
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Scopus Citedby
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ID information
  • DOI : 10.1021/acs.jpcc.0c04974
  • ISSN : 1932-7447
  • eISSN : 1932-7455
  • SCOPUS ID : 85099993894

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