MISC

2007年11月

Dissolution characteristics and reaction kinetics of molecular resists for extreme-ultraviolet lithography

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
  • Minoru Toriumi
  • ,
  • Julius Santillan
  • ,
  • Toshiro Itani
  • ,
  • Takahiro Kozawa
  • ,
  • Seiichi Tagawa

25
6
開始ページ
2486
終了ページ
2489
記述言語
英語
掲載種別
DOI
10.1116/1.2787850
出版者・発行元
A V S AMER INST PHYSICS

Molecular resist of polyphenol was evaluated as an extreme-ultraviolet resist compared with a polymer resist of p(tert-butoxycarbonyl-hydroxystyrene). The molecular resist shows higher sensitivity than the polymer resist. The dissolution behavior was studied by quartz crystal microbalance method. The molecular resist shows thinner swelling layer than the polymer resist. The deprotection mechanism was approximated by simple reaction equations, and Fourier-transform infrared spectra were interpreted to give the products of a quantum yield and a deprotection rate constant as 6.2 x 10(-8) and 6.0 x 10(-8) cm(3)/molecules s for molecular and polymer resists. Both deprotection efficiencies are almost same. The higher sensitivity of the molecular resist is due to the dissolution behavior not the reaction mechanism. (C) 2007 American Vacuum Society.

リンク情報
DOI
https://doi.org/10.1116/1.2787850
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000251611900145&DestApp=WOS_CPL
ID情報
  • DOI : 10.1116/1.2787850
  • ISSN : 1071-1023
  • Web of Science ID : WOS:000251611900145

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