藤井麻樹子 (Makiko Fujii) - マイポータル

基本情報

所属: 横浜国立大学大学院環境情報研究院講師

学位: 博士（工学）(東京大学)

研究者番号: 70723443
J-GLOBAL ID: 201701005466995684
researchmap会員ID: B000277207

外部リンク

研究キーワード

研究分野

論文

Effects of molecular weight and cationization agent on the sensitivity of Bi cluster secondary ion mass spectrometry

Makiko Fujii, Rie Shishido, Takaya Satoh, Shigeru Suzuki, Jiro Matsuo

RAPID COMMUNICATIONS IN MASS SPECTROMETRY 30(14) 1722-1726 2016年7月査読有り
Peptide Fragmentation and Surface Structural Analysis by Means of ToF-SIMS Using Large Cluster Ion Sources

Yuta Yokoyama, Satoka Aoyagi, Makiko Fujii, Jiro Matsuo, John S. Fletcher, Nicholas P. Lockyer, John C. Vickerman, Melissa K. Passarelli, Rasmus Havelund, Martin P. Seah

ANALYTICAL CHEMISTRY 88(7) 3592-3597 2016年4月査読有り
Observation of Liquid Water with Ambient SIMS

Kusakari M., Fujii M., Seki T., Aoki T., Matsuo J.

Transactions of the Materials Research Society of Japan 41(3) 309-311 2016年
Yields and images of secondary ions from organic materials by different primary Bi ions in time-of-flight secondary ion mass spectrometry

Shishido, R., Fujii, M., Seki, T., Aoki, T., Matsuo, J., Suzuki, S.

Rapid Communications in Mass Spectrometry 30(4) 476-482 2016年査読有り
Development of ambient SIMS using mega-electron-volt-energy ion probe

Masakazu Kusakari, Makiko Fujii, Toshio Seki, Takaaki Aoki, Jiro Matsuo

Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 34(3) 2016年査読有り
Ambient analysis of liquid materials with Wet-SIMS

Seki, T., Kusakari, M., Fujii, M., Aoki, T., Matsuo, J.

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 371 189-193 2016年査読有り
Development of Low-vacuum SIMS instruments with large cluster Ion beam

Suzuki, K., Kusakari, M., Fujii, M., Seki, T., Aoki, T., Matsuo, J.

Surface and Interface Analysis 48(11) 1119-1121 2016年査読有り
Molecular cluster emission in sputtering of amino acids by argon gas-cluster ions

Masakazu Kusakari, Hubert Gnaser, Makiko Fujii, Toshio Seki, Takaaki Aoki, Jiro Matsuo

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY 383 31-37 2015年5月査読有り
Mass analysis by Ar-GCIB-dynamic SIMS for organic materials

Masato Suzuki, Masashi Nojima, Makiko Fujii, Toshio Seki, Jiro Matsuo

SURFACE AND INTERFACE ANALYSIS 47(2) 298-300 2015年2月査読有り
Analysis of liquid materials in low vacuum with Wet-SIMS

Toshio Seki, Makiko Fujii, Masakazu Kusakari, Shunichiro Nakagawa, Takaaki Aoki, Jiro Matsuo

SURFACE AND INTERFACE ANALYSIS 46(12-13) 1133-1136 2014年12月査読有り
Quantitative analysis of lipids with argon gas cluster ion beam secondary ion mass spectrometry

Makiko Fujii, Shunichirou Nakagawa, Toshio Seki, Takaaki Aoki, Jiro Matsuo

SURFACE AND INTERFACE ANALYSIS 46(12-13) 1129-1132 2014年12月査読有り
Investigation of mixing effects of silicon isotopes under shave-off condition using atom probe tomography

Masanobu Karasawa, Makiko Fujii, Masato Morita, Satoshi Ishimura, Norihito Mayama, Hiroshi Uchida, Yoko Kawamura, Kohei M. Itoh, Masanori Owari

SURFACE AND INTERFACE ANALYSIS 46(12-13) 1200-1203 2014年12月査読有り
Development of organic SIMS system with Ar-GCIB and IMS-4f

Masashi Nojima, Masato Suzuki, Makiko Fujii, Toshio Seki, Jiro Matsuo

SURFACE AND INTERFACE ANALYSIS 46 368-371 2014年11月査読有り
Lipid compounds analysis with MeV-SIMS apparatus for biological applications

Makiko Fujii, Masakazu Kusakari, Kazuhiro Matsuda, Naoki Man, Toshio Seki, Takaaki Aoki, Jiro Matsuo

SURFACE AND INTERFACE ANALYSIS 46 353-356 2014年11月査読有り
Novel SIMS system with focused massive cluster ion source for mass imaging spectrometry with high lateral resolution

Jiro Matsuo, Souta Torii, Kazuki Yamauchi, Keisuke Wakamoto, Masakazu Kusakari, Shunichiro Nakagawa, Makiko Fujii, Takaaki Aoki, Toshio Seki

APPLIED PHYSICS EXPRESS 7(5) 2014年5月査読有り
Study on the detection limits of a new argon gas cluster ion beam secondary ion mass spectrometry apparatus using lipid compound samples

Makiko Fujii, Shunichirou Nakagawa, Kazuhiro Matsuda, Naoki Man, Toshio Seki, Takaaki Aoki, Jiro Matsuo

RAPID COMMUNICATIONS IN MASS SPECTROMETRY 28(8) 917-920 2014年4月査読有り
Prolific cluster emission in sputtering of phenylalanine by argon-cluster ion bombardment

Hubert Gnaser, Makiko Fujii, Shunichirou Nakagawa, Toshio Seki, Takaaki Aoki, Jiro Matsuo

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY 360(1) 54-57 2014年3月査読有り
Low Vacuum SIMS Measurements of Higher Alcohols with MeV-energy Heavy Ion Beam

Kusakari Masakazu, Fujii Makiko, Seki Toshio, Aoki Takaaki, Matsuo Jiro

Transactions of the Materials Research Society of Japan 39(3) 265-268 2014年
Peptide dissociation patterns in secondary ion mass spectrometry under large argon cluster ion bombardment

Hubert Gnaser, Makiko Fujii, Shunichirou Nakagawa, Toshio Seki, Takaaki Aoki, Jiro Matsuo

Rapid Communications in Mass Spectrometry 27(13) 1490-1496 2013年査読有り
Study on the fundamental predominance in shave-off depth profiling

M. Fujii, M. Owari

SURFACE AND INTERFACE ANALYSIS 45(1) 122-125 2013年1月査読有り

もっとみる

MISC

Development of ambient SIMS using MeV-energy ion probe

Kusakari M., Fujii M., Seki T., Aoki T., Matsuo J.

Annual report of Quantum Science and Engineering Center 18 21-25 2016年4月
Lipid Compounds Analysis with MeV-SIMS Apparatus

Fujii M., Kusakari M., Seki T., Aoki T., Matsuo J.

Annual report of Quantum Science and Engineering Center 16 22-24 2014年4月
Shave‐off深さ方向分析法におけるメモリー効果の低減

野島雅, 藤井麻樹子, 石崎泰裕, 尾張真則, 二瓶好正

分析化学 57(1) 67-69 2008年1月5日

藤井麻樹子

基本情報

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論文

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