2006年
Characterization of SiC diodes in extremely high temperature ambient
APEC 2006: TWENTY-FIRST ANNUAL IEEE APPLIED POWER ELECTRONICS CONFERENCE AND EXPOSITION, VOLS 1-3
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- 巻
- 14.1, pp.441-447
- 号
- 開始ページ
- 441
- 終了ページ
- 447
- 記述言語
- 英語
- 掲載種別
- 出版者・発行元
- IEEE
This paper discusses the static and dynamic behavior of the body diode buried in Sic JFETs and Sic Schottky Barrier Diodes (SBDs). The device parameters are extracted from experimental results and their temperature dependencies are discussed. There is reverse current flow from source to drain in the channel of JFETs for on condition at low temperatures. In higher temperatures, it tends to flow through the body diode due to the increase of the resistance across the channel. The dynamic characteristics indicate that the reverse recovery phenomena of the body diode in a Sic JFET deteriorates with increasing temperature. It is therefore desirable to add an external Sic SBD for improving the static and dynamic behavior for high temperature operation of Sic JFETs.
- リンク情報
- ID情報
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- ISSN : 1048-2334
- Web of Science ID : WOS:000236635700068