2014年
Effect of diode characteristics on conducted noise spectrum in CCM boost converter
2014 INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC EUROPE)
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- 開始ページ
- 59
- 終了ページ
- 64
- 記述言語
- 英語
- 掲載種別
- 研究論文(国際会議プロシーディングス)
- 出版者・発行元
- IEEE
This paper aimed at modeling EMI noise source of the continuous current mode (CCM) DC-DC converter. To this end, this paper focuses on the reverse recovery phenomenon of Si and SiC diodes which is induced in its turn-off operation. This paper also studies the effect of the input voltage level on the recovery current and on the conducted EMI noise in CCM DC-DC boost converter under periodic steady-state operation. The result shows that the terminal capacitance of diodes determines the noise spectrum distribution especially for higher than 30 MHz.
- リンク情報
- ID情報
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- ISSN : 2158-110X
- Web of Science ID : WOS:000364988600013