2011年9月
A study on modeling of dynamic characteristics of circuit component in TDR measurement based on Prony analysis
IEICE ELECTRONICS EXPRESS
- ,
- 巻
- 8
- 号
- 18
- 開始ページ
- 1534
- 終了ページ
- 1540
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.1587/elex.8.1534
- 出版者・発行元
- IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG
Identification and modeling of parasitic components in power electronics circuit has become a notable issue for electromagnetic compatibility (EMC) design to achieve faster and higher-frequency switching operations. This paper characterizes and models the dynamic behavior of circuit components with reflectometry measurement in a time domain. To this end, Prony analysis is applied to the TDR measurement data. The proposed method readily identifies the model order and is tolerant to measurement noise.
- リンク情報
- ID情報
-
- DOI : 10.1587/elex.8.1534
- ISSN : 1349-2543
- Web of Science ID : WOS:000295836000012