論文

査読有り
2011年9月

A study on modeling of dynamic characteristics of circuit component in TDR measurement based on Prony analysis

IEICE ELECTRONICS EXPRESS
  • Takaaki Ibuchi
  • ,
  • Tsuyoshi Funaki

8
18
開始ページ
1534
終了ページ
1540
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1587/elex.8.1534
出版者・発行元
IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG

Identification and modeling of parasitic components in power electronics circuit has become a notable issue for electromagnetic compatibility (EMC) design to achieve faster and higher-frequency switching operations. This paper characterizes and models the dynamic behavior of circuit components with reflectometry measurement in a time domain. To this end, Prony analysis is applied to the TDR measurement data. The proposed method readily identifies the model order and is tolerant to measurement noise.

リンク情報
DOI
https://doi.org/10.1587/elex.8.1534
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000295836000012&DestApp=WOS_CPL
ID情報
  • DOI : 10.1587/elex.8.1534
  • ISSN : 1349-2543
  • Web of Science ID : WOS:000295836000012

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