論文

2020年11月23日

EMI characterization for power conversion circuit with SiC power devices

Proceedings of the Asian Test Symposium
  • Takaaki Ibuchi
  • ,
  • Tsuyoshi Funaki

2020-November
記述言語
掲載種別
研究論文(国際会議プロシーディングス)
DOI
10.1109/ATS49688.2020.9301613

© 2020 IEEE. The fast switching characteristics of silicon carbide (SiC) power devices can be expected to realize low losses, light weight, and compact power converters. However, high dv/dt and di/dt during switching transients raise the concerns of electromagnetic interference (EMI) for high-power converters. This report focuses on the switching characteristics of SiC power devices, and discusses the relationship between their transient characteristics and EMI noise sources for power conversion circuit.

リンク情報
DOI
https://doi.org/10.1109/ATS49688.2020.9301613
Scopus
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85099130446&origin=inward
Scopus Citedby
https://www.scopus.com/inward/citedby.uri?partnerID=HzOxMe3b&scp=85099130446&origin=inward
ID情報
  • DOI : 10.1109/ATS49688.2020.9301613
  • ISSN : 1081-7735
  • SCOPUS ID : 85099130446

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