Kazuyuki Hirose

Development of Thin Perovskite Solar Cells for Balloon Experiments

S. Kanaya, H. Fuke, Y. Miyazawa, H. Toyota, K. Hirose, R. Funayama, M. Ikegami

33rd International Symposium on Space Technology and Science, 2022

Flight Tests of Perovskite Solar Cell toward Applications to Balloon Envelope

Hi. Fuke, S. Kanaya, Y. Miyazawa, Hi. Toyota, K. Hirose, R. Funayama, M. Ikegami

33rd International Symposium on Space Technology and Science, 2022

Balloon flight test of thin-film-type perovskite solar cell

H. Fuke, S. Kanaya, Y. Miyazawa, H. Toyota, K. Hirose, R. Funayama, M. Ikegami

International Symposium on Solar Energy and Efficient Energy Usage (11th SOLARIS 2021), Sep 29, 2021

Balloon flight demonstration of perovskite solar cell toward applications to inflatable structures

H. Fuke, S. Kanaya, M. Y, H. Toyota, K. Hirose, M. Ikegami

The 30th International Photovoltaic Science and Engineering Conference (PVCEC-30), Nov 11, 2020

XPS study on film thickness dependence of surface charge-up and resistance of SiO2 films on Si

K. Ushimaru, T. Harie, D. Kobayashi, T. Yamamoto, K. Hirose

2019 International Workshop on DIELECTRIC THIN FILMS FOR FUTURE ELECTRON DEVICES -SCIENCE AND TECHNOLOGY- (IWDTF 2019), Nov 18, 2019

Data retention voltage based analysis of systematic variations in SRAM SEU hardness: A possible solution to synergetic effects of TID

D. Kobayashi, K. Hirose, K. Sakamoto, S. Okamoto, S. Baba, H. Shindou, O. Kawasaki, T. Makino, T. Ohshima, Y. Mori, D. Matsuura, M. Kusano, T. Narita, S. Ishii

2019 IEEE Nuclear and Space Radiation Effects Conference (NSREC), Jul 12, 2019

Investigation of buried-well potential perturbation effects on SEU in SOI DICE-based flip-flop under proton irradiation

K. Sakamoto, S. Baba, S. Okamoto, H. Shindou, O. Kawasaki, D. Kobayashi, K. Hirose, T. Makino, Y. Mori, D. Matsuura, M. Kusano, T. Narita, S. Ishii

2019 IEEE Nuclear and Space Radiation Effects Conference (NSREC), Jul 9, 2019

Innovative avionics miniaturization by chip-level integration using vertical assemble technique

S. Fukuda, M. Mita, K. Hirose, M. Kato, S. Iriyama

32nd International Synposium on Space Technology and Science (ISTS 2019), Jun 21, 2019

Theoretical estimation of breakdown electric field of B-Al-Ga nitride polymorphs

H. Zhang, D. Kobayashi, T. Yamamoto, K. Hirose

The 6th International Symposium on Advanced Microscopy and Theoretical Calculations (AMTC6), Jun, 2019

Physics and Space Applications of Advanced Silicon Devices

K. Hirose, D. Kobayashi

BIT’s 5th Annual World Congress of Smart Materials-2019 ( WCSM-2019), Mar 8, 2019 Invited

X-ray photoelectron spectroscopy study on SiO2/Si interfaces of advanced MOSFETs

K. Hirose, D. Kobayashi

International Conference on Electronics, Communications and Networks (CECNet 2018), Nov 17, 2018 Invited

Advantages and disadvantages of SOI in terms of radiation tolerance

K. Hirose, D. Kobayashi

IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S Conference 2018), Oct 16, 2018 Invited

X-Ray Photoelectron Spectroscopy Study on Reliability of Advanced MOSFETs

K. Hirose, D. Kobayashi

Nov 25, 2017 Invited

Photoemission and molecular orbital calculation study on atomic structures and physical properties at (SiO2-Si)-interfaces

K. Hirose, D. Kobayashi

18th Research Workshop on Nucleation Theory and Applications, Apr, 2014 Invited

Estimation of breakdown electric-field strength of SiO2 with oxygen vacancies or strains using first-principles molecular orbital calculation

K. Hirose, H. Seki, S. Wakao, Y. Shibuya, D. Kobayashi, H. Nohira, K. Yasuoka, T. Yamamoto

The 14th International Conference on the Formation of Semiconductor Interfaces (ICFSI-14), Jun, 2013

XPS time-dependent measurement on the trap density at ultrathin SiO2/Si interfaces: comparison to (100), (110), and (111) Si orientations

K. Hirose, S. Igarashi, Y. Ishihara, Y. Shibuya, D. Kobayashi, K. Ueno, H. Nohira

13th International Conference on the Formation of Semiconductor Interfaces (13th ICFSI), Jul, 2011

Estimation technique for optical dielectric constant of polymorphous SiO2 through first-principles molecular orbital calculation

K. Hirose, D. Kobayashi, S. Igarashi, H. Nohira

12th International Conference on Modern Materials and Technologies (CIMTEC), Jun, 2010

First-principles calculation of the s later transition state for estimating optical dielectric constants of Si and Al dielectric compounds

K. Hirose, H. Suzuki, D. Kobayashi, H. Nohira

7th Symposium SiO2 Advanced Dielectrics and Related Devices (SiO2 2008), Jun, 2008

Relationship between optical dielectric constant and XPS relative chemical shift of 1s and 2p levels for dielectric compounds

K. Hirose, H. Suzuki, H. Nohira, E. Ikenaga, D. Kobayashi, T. Hattori

13th International Conference on Surface Science (ICSS), Jul, 2007

X-ray photoelectron spectroscopy study on dielectric properties at gate insulator film/Si interfaces

K. Hirose, H. Nohira, D. Kobayashi, T. Hattori

8th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT), Oct, 2006 Invited

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