2016年3月
Portable ultrahigh-vacuum sample storage system for polarization-dependent total-reflection fluorescence x-ray absorption fine structure spectroscopy
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
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- 巻
- 34
- 号
- 2
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.1116/1.4936344
- 出版者・発行元
- A V S AMER INST PHYSICS
A portable ultrahigh-vacuum sample storage system was designed and built to investigate the detailed geometric structures of mass-selected metal clusters on oxide substrates by polarization-dependent total-reflection fluorescence x-ray absorption fine structure spectroscopy (PTRF-XAFS). This ultrahigh-vacuum (UHV) sample storage system provides the handover of samples between two different sample manipulating systems. The sample storage system is adaptable for public transportation, facilitating experiments using air-sensitive samples in synchrotron radiation or other quantum beam facilities. The samples were transferred by the developed portable UHV transfer system via a public transportation at a distance over 400 km. The performance of the transfer system was demonstrated by a successful PTRF-XAFS study of Pt-4 clusters deposited on a TiO2(110) surface. (C) 2015 American Vacuum Society.
- リンク情報
- ID情報
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- DOI : 10.1116/1.4936344
- ISSN : 0734-2101
- eISSN : 1520-8559
- Web of Science ID : WOS:000372352300048