論文

査読有り
2016年3月

Portable ultrahigh-vacuum sample storage system for polarization-dependent total-reflection fluorescence x-ray absorption fine structure spectroscopy

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
  • Yoshihide Watanabe
  • ,
  • Yusaku F. Nishimura
  • ,
  • Ryo Suzuki
  • ,
  • Hiromitsu Uehara
  • ,
  • Tomoyuki Nimura
  • ,
  • Atsushi Beniya
  • ,
  • Noritake Isomura
  • ,
  • Kiyotaka Asakura
  • ,
  • Satoru Takakusagi

34
2
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1116/1.4936344
出版者・発行元
A V S AMER INST PHYSICS

A portable ultrahigh-vacuum sample storage system was designed and built to investigate the detailed geometric structures of mass-selected metal clusters on oxide substrates by polarization-dependent total-reflection fluorescence x-ray absorption fine structure spectroscopy (PTRF-XAFS). This ultrahigh-vacuum (UHV) sample storage system provides the handover of samples between two different sample manipulating systems. The sample storage system is adaptable for public transportation, facilitating experiments using air-sensitive samples in synchrotron radiation or other quantum beam facilities. The samples were transferred by the developed portable UHV transfer system via a public transportation at a distance over 400 km. The performance of the transfer system was demonstrated by a successful PTRF-XAFS study of Pt-4 clusters deposited on a TiO2(110) surface. (C) 2015 American Vacuum Society.

リンク情報
DOI
https://doi.org/10.1116/1.4936344
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000372352300048&DestApp=WOS_CPL
ID情報
  • DOI : 10.1116/1.4936344
  • ISSN : 0734-2101
  • eISSN : 1520-8559
  • Web of Science ID : WOS:000372352300048

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