2015年3月
A high-temperature in situ cell with a large solid angle for fluorescence X-ray absorption fine structure measurement
REVIEW OF SCIENTIFIC INSTRUMENTS
- 巻
- 86
- 号
- 3
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.1063/1.4914459
- 出版者・発行元
- AMER INST PHYSICS
We present the design and performance of a high-temperature in situ cell with a large solid angle for fluorescence X-ray absorption fine structure (XAFS) spectra. The cell has a large fluorescence XAFS window (116 mm(phi)) near the sample in the cell, realizing a large half-cone angle of 56 degrees. We use a small heater (25 x 35 mm(2)) to heat the sample locally to 873 K. We measured a Pt-SnO2 thin layer on a Si substrate at reaction conditions having a high activity. In situ measurement enables the analysis of the difference XAFS spectra between before and during the reaction to reveal the structure change during the operation. (C) 2015 AIP Publishing LLC.
- リンク情報
- ID情報
-
- DOI : 10.1063/1.4914459
- ISSN : 0034-6748
- eISSN : 1089-7623
- Web of Science ID : WOS:000352201400045