2012年7月31日
A novel method for the determination of the full energetic distribution of interface state density in metal/insulator/ GaN structures from capacitance -voltage and photocapacitance - light intensity measurements
31st International Conference on the Physics of Semiconductors, July 29th - August 3rd, 2012, Zurich, Switzerland
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- 記述言語
- 英語
- 会議種別
Poster