The authors invented the transXend detector, which measures X-rays as electric currents, and then gives the energy distribution of the X-rays after an unfolding process. In a previous paper, it was shown that the material thickness distributions can be estimated with the transXend detector by using reference points plotted from the electric current ratios, such as the I-2/I-1 - I-3/I-1 graph, where I-i denotes the electric current measured by the i-th segment of the transXend detector. In this paper, the tomographic images of iodine, aluminum, and the acrylic those surround the other two materials are reconstructed from their material thickness distributions, which are estimated from two X-ray incidence directions. The X-ray event ratios are also used to estimate the material thickness distributions.