論文

2013年3月

Measurement methods for surface oxides on SUS 316L in simulated light water reactor coolant environments using synchrotron XRD and XRF

JOURNAL OF NUCLEAR MATERIALS
  • Masashi Watanabe
  • ,
  • Toshio Yonezawa
  • ,
  • Takahisa Shobu
  • ,
  • Tetsuo Shoji

434
1-3
開始ページ
189
終了ページ
197
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1016/j.jnucmat.2012.10.049
出版者・発行元
ELSEVIER SCIENCE BV

Synchrotron X-ray diffraction (XRD) and X-ray fluorescent (XRF) measurement techniques have been used for non-destructive characterization of surface oxide films on Type 316L austenitic stainless steels that were exposed to simulated primary water environments of pressurized water reactors (PWR) and boiling water reactors (BWR). The layer structures of the surface spinel oxides were revealed ex situ after oxidation by measurements made as a function of depth. The layer structure of spinel oxides formed in simulated PWR primary water should normally be different from that formed in simulated BWR water. After oxidation in the simulated BWR environment, the spinel oxide was observed to contain NiFe2O4 at shallow depths, and FeCr2O4 and Fe3O4 at deeper depths. By contrast, after oxidation in the simulated PWR primary water environment, a Fe3O4 type spinel was observed near the surface and FeCr2O4 type spinel near the interface with the metal substrate. Furthermore, by in situ measurements during oxidation in the simulated BWR environment, it was also demonstrated that the ratio between spinel and hematite Fe2O3 can be changed depending on the water condition such as BWR normal water chemistry or BWR hydrogen water chemistry. (C) 2012 Elsevier B.V. All rights reserved.

リンク情報
DOI
https://doi.org/10.1016/j.jnucmat.2012.10.049
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000315752000024&DestApp=WOS_CPL
URL
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84871758400&origin=inward
ID情報
  • DOI : 10.1016/j.jnucmat.2012.10.049
  • ISSN : 0022-3115
  • SCOPUS ID : 84871758400
  • Web of Science ID : WOS:000315752000024

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