Sakata Osami

J-GLOBAL         Last updated: Sep 26, 2019 at 08:38
 
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Name
Sakata Osami
Affiliation
National Institute for Materials Science

Academic & Professional Experience

 
Jul 2018
 - 
Today
Fileld Coordinator, Quantum Beam Field, Research Center for Advanced Measurement and Characterization, NIMS
 
Apr 2016
 - 
Today
Group Leader, Synchrotron X-ray Characterization Group, Center for GaN Characterization and Analysis, NIMS
 
Oct 2013
 - 
Today
Group Leader, Synchrotron X-ray Group, Research Center for Advanced Measurement and Characterization, NIMS
 
Oct 2012
 - 
Mar 2018
Adjunct Professor, Department of Innovative and Engineered Materials, Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology
 
Apr 2011
 - 
Today
Station Director, Synchrotron X-ray Station at SPring-8, National Institute for Materials Science (NIMS)
 
Apr 2001
 - 
Mar 2011
Research Scientist, Team Leader, Surface Structure Team, Japan Synchrotron Radiation Research Institute
 
Jun 2000
 - 
Apr 2001
Research Scientist, Japan Synchrotron Radiation Research Institute
 
Apr 1998
 - 
Jun 2000
Research Associate, Department of Materials Science and Engineering, Northwestern University
 
May 1989
 - 
Apr 1998
Research Associate, Tokyo Institute of Technology
 

Awards & Honors

 
Oct 2012
日本結晶学会賞・学術賞, The Crystallographic Society of Japan
 

Published Papers

 
Takanori Mimura, Takao Shimizu, Hiroshi Uchida, Osami Sakata, Hiroshi Funakubo
APPLIED PHYSICS LETTERS   113(10) 102901-1-102901-4   Sep 2018   [Refereed]
Thickness dependence of crystal structure and electric property of (111)-oriented epitaxial 0.07Y2O3-0.93HfO2 (YHO7) ferroelectric films were investigated for the film thickness range of 10-111 nm. The YHO7 films were grown by pulsed laser deposit...
Okkyun Seo, Akhil Tayal, Jaemyung Kim, Chulho Song, Yanna Chen, Satoshi Hiroi, Yoshio Katsuya, Toshiaki Ina, Osami Sakata, Yuki Ikeya, Shiori Takano, Akifumi Matsuda, Mamoru Yoshimoto
Scientific Reports   9(1)    Dec 2019   [Refereed]
We have investigated the structural, optical band gap, and electrical properties of (Fe2O3)0.5x:(NiO)1−0.5x (x = 0.3, 0.4, 0.5, 0.6 and 0.7) epitaxial thin films grown on an atomically smooth substrate at room temperature. With increasing Fe2O3 co...
Okkyun Seo, Jaemyung Kim, Satoshi Hiroi, Chulho Song, L. S. R. Kumara, Akhil Tayal, Yanna Chen, Hirokazu Kobayashi, Hiroshi Kitagawa, Osami Sakata
APPLIED PHYSICS LETTERS   113(7) 071907-1-5   Aug 2018   [Refereed]
Crystal structure deviations of bimetallic Pd-Pt nanoparticles (NPs) were investigated using synchrotron high-energy X-ray diffraction. The samples comprised Pd NPs and bimetallic Pd-Pt NPs featuring those with a Pd-core/Pt-shell structure as well...
Okkyun Seo, Jaemyung Kim, Akhil Tayal, Chulho Song, L. S. R. Kumara, Shun Dekura, Hirokazu Kobayashi, Hiroshi Kitagawa, Osami Sakata
RSC Advances   9(37) 21311-21317   Jul 2019   [Refereed]
We investigated the relation between crystalline disorder and electronic structure deviations of Pd nanoparticles (NPs) and their hydrogen storage properties as a function of their particle diameter (2.0, 4.6, and 7.6 nm) using various synchrotron...
Jaemyung Kim, Okkyun Seo, Atsushi Tanaka, Jun Chen, Kenji Watanabe, Yoshio Katsuya, Toshihide Nabatame, Yoshihiro Irokawa, Yasuo Koide, Osami Sakata
CrystEngComm   21(27) 4036-4041   Jul 2019   [Refereed]
We have observed anisotropic mosaicity of an m-plane GaN homoepitaxial layer by x-ray diffraction topography imaging over a wafer and x-ray rocking curves measured at various wafer points. Crystal domains were well aligned along the [0001] directi...