A radio-photoluminescence (RPL) dosimeter with a copper-ion luminescent center was fabricated to evaluate its response in ionized particle detection. A focused proton microbeam with varying energies up to 3 MeV and heavy ions of 490 MeV osmium (Os) were employed along with X-rays to evaluate its performance in micrometer-scale radiation monitoring. The response to ionized particles was evaluated under focused proton beam irradiation where the peak wavelength differed from that obtained under X-ray irradiation. Two peaks were observed under Os irradiation where the secondary-generated particles and photons have a significant effect on the dosimeter. The results suggest that the fabricated RPL dosimeter with copper luminescence center could be used to estimate the irradiation effect of primary ionized particles separately from the effects of secondary particles, photons, and environmental background radiation.