2017年10月31日
Shielding effect on secondary cosmic-ray neutron- and muon-induced soft errors
Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
- ,
- 巻
- 2016-
- 号
- 開始ページ
- 1
- 終了ページ
- 5
- 記述言語
- 英語
- 掲載種別
- 研究論文(国際会議プロシーディングス)
- DOI
- 10.1109/RADECS.2016.8093141
- 出版者・発行元
- Institute of Electrical and Electronics Engineers Inc.
Transports of secondary cosmic-ray neutrons and muons in a building and a stacked server are simulated by Particle and Heavy Ion Transport code System (PHITS) with considering distributions of energy and zenith-angle of secondary cosmic-rays by PHITS based analytical radiation model in the atmosphere (PARMA) model. The calculated neutron fluxes are in surprisingly good agreement with measured data. Soft errors in an n-type metal-oxide-semiconductor field-effect transistor caused by secondary cosmic-ray neutron and muon in the open air and on the first floor of the building are analyzed based on the multiple sensitive volume (MSV) model using PHITS. It is found that the secondary cosmic-ray neutron-induced SER decrease by shielding effect of the building while that caused by secondary cosmic-ray muons is not affected.
- ID情報
-
- DOI : 10.1109/RADECS.2016.8093141
- SCOPUS ID : 85043605408