2019年
Valence-selective local atomic structures in inorganic materials by X-ray fluorescence holography
Japanese Journal of Applied Physics
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- 巻
- 58
- 号
- 12
- 記述言語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.7567/1347-4065/ab5258
- 出版者・発行元
- Japan Society of Applied Physics
© 2019 The Japan Society of Applied Physics. X-ray fluorescence holography (XFH) can be used to conduct atom-resolved structural characterization of materials around a specific element, and has been applied to various functional materials. Recently, a valence-selective function has been found by this technique by employing incident X-ray energies near an absorption edge of a specified element. In this article, the principle and experimental procedure of a valence-selective XFH and subsequent data analysis procedure using the sparse modeling approach of L1 regression are introduced. Then, the excellent XFH results with valence-selective studies are reviewed, such as Y oxide thin film, YbInCu4 valence transition material, and Fe3O4 mixed valence material.
- リンク情報
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- DOI
- https://doi.org/10.7567/1347-4065/ab5258
- Web of Science
- https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000498850300001&DestApp=WOS_CPL
- Scopus
- https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85080048920&origin=inward
- Scopus Citedby
- https://www.scopus.com/inward/citedby.uri?partnerID=HzOxMe3b&scp=85080048920&origin=inward
- URL
- http://orcid.org/0000-0002-7810-6062
- ID情報
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- DOI : 10.7567/1347-4065/ab5258
- ISSN : 0021-4922
- eISSN : 1347-4065
- ORCIDのPut Code : 63845833
- SCOPUS ID : 85080048920
- Web of Science ID : WOS:000498850300001