A single-event latch-up (SEL) test using a 252Cf radioisotope was carried out. The results were compared with those of a proton test and from observation in orbit. A radioisotope can reproduce phenomena observed in orbit that are caused by protons. Considering the inexpensive nature of the 252Cf test, it is more suitable for nanosatellites that require low cost and fast delivery. A SEL occurrence rate of a commercial-off-the-shelf microprocessor was derived from the ground test results. The 252Cf test provided a SEL rate approximately 1×106 times greater than that in orbit. This data can be used to derive the minimum SEL occurrence rate in orbit and help satellite designers to evaluate the risk of SEL and take measures if necessary.