論文

2021年3月

Ghost Imaging with Deep Learning for Position Mapping of Weakly Scattered Light Source

Nanomanufacturing and Metrology
  • Yasuhiro Mizutani
  • ,
  • Shoma Kataoka
  • ,
  • Tsutomu Uenohara
  • ,
  • Yasuhiro Takaya

4
1
開始ページ
37
終了ページ
45
記述言語
掲載種別
研究論文(学術雑誌)
DOI
10.1007/s41871-020-00085-0
出版者・発行元
Springer Science and Business Media LLC

<title>Abstract</title>We propose ghost imaging (GI) with deep learning to improve detection speed. GI, which uses an illumination light with random patterns and a single-pixel detector, is correlation-based and thus suitable for detecting weak light. However, its detection time is too long for practical inspection. To overcome this problem, we applied a convolutional neural network that was constructed based on a classification of the causes of ghost image degradation. A feasibility experiment showed that when using a digital mirror device projector and a photodiode, the proposed method improved the quality of ghost images.

リンク情報
DOI
https://doi.org/10.1007/s41871-020-00085-0
URL
http://link.springer.com/content/pdf/10.1007/s41871-020-00085-0.pdf
URL
http://link.springer.com/article/10.1007/s41871-020-00085-0/fulltext.html
ID情報
  • DOI : 10.1007/s41871-020-00085-0
  • ISSN : 2520-811X
  • eISSN : 2520-8128

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