2021年3月
Ghost Imaging with Deep Learning for Position Mapping of Weakly Scattered Light Source
Nanomanufacturing and Metrology
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- ,
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- 巻
- 4
- 号
- 1
- 開始ページ
- 37
- 終了ページ
- 45
- 記述言語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.1007/s41871-020-00085-0
- 出版者・発行元
- Springer Science and Business Media LLC
<title>Abstract</title>We propose ghost imaging (GI) with deep learning to improve detection speed. GI, which uses an illumination light with random patterns and a single-pixel detector, is correlation-based and thus suitable for detecting weak light. However, its detection time is too long for practical inspection. To overcome this problem, we applied a convolutional neural network that was constructed based on a classification of the causes of ghost image degradation. A feasibility experiment showed that when using a digital mirror device projector and a photodiode, the proposed method improved the quality of ghost images.
- リンク情報
- ID情報
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- DOI : 10.1007/s41871-020-00085-0
- ISSN : 2520-811X
- eISSN : 2520-8128