論文

査読有り
2000年

New evaluating method of machined surface uniformity using image processing

PROGRESS OF MACHINING TECHNOLOGY
  • T Sugino
  • ,
  • Y Yamane
  • ,
  • S Wakaoka
  • ,
  • N Narutaki

開始ページ
976
終了ページ
980
記述言語
英語
掲載種別
研究論文(国際会議プロシーディングス)
出版者・発行元
AVIATION INDUSTRY PRESS

This pager describes an evaluating method for uniformity of machined surfaces using image processing. To evaluate wide area rapidly, variances of luminance (brightness) distributions obtained by a CCD camera are used. The uniformity of the surface is judged by a slope of an evaluation curve, which is transition of mean value of variances that are obtained from each luminance distribution of segmented small regions. The curve of an uniform image from normal machined surface is almost even while that of non-uniform image fi om chattered marks, scratches or dents, rises to some degree as a side size of small region increases. Therefore,the uniformity can be evaluated by comparing the slopes of the evaluation curves.

リンク情報
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000166933200179&DestApp=WOS_CPL
ID情報
  • Web of Science ID : WOS:000166933200179

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