2000年
New evaluating method of machined surface uniformity using image processing
PROGRESS OF MACHINING TECHNOLOGY
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- 開始ページ
- 976
- 終了ページ
- 980
- 記述言語
- 英語
- 掲載種別
- 研究論文(国際会議プロシーディングス)
- 出版者・発行元
- AVIATION INDUSTRY PRESS
This pager describes an evaluating method for uniformity of machined surfaces using image processing. To evaluate wide area rapidly, variances of luminance (brightness) distributions obtained by a CCD camera are used. The uniformity of the surface is judged by a slope of an evaluation curve, which is transition of mean value of variances that are obtained from each luminance distribution of segmented small regions. The curve of an uniform image from normal machined surface is almost even while that of non-uniform image fi om chattered marks, scratches or dents, rises to some degree as a side size of small region increases. Therefore,the uniformity can be evaluated by comparing the slopes of the evaluation curves.
- リンク情報
- ID情報
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- Web of Science ID : WOS:000166933200179