SEKI Toshio

J-GLOBAL         Last updated: Sep 25, 2019 at 02:40
 
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Name
SEKI Toshio
Affiliation
Kyoto University
Section
Graduate School of Engineering, Department of Nuclear Engineering, Graduate School of Engineering Department of Nuclear Engineering
Job title
Lecturer,Lecturer
Degree
Doctor(Engineering)(Kyoto University)

Research Interests

 
 

Research Areas

 
 

Education

 
 
 - 
2000
Graduate School, Division of Engineering, Kyoto University
 

Awards & Honors

 
Nov 2016
Best Presentation Award, The 38th International Symposium on Dry Process (DPS2016)
 
1998
Best Student Award of Ion Implantation Technology Conference
 

Published Papers

 
Prutchayawoot Thopan, Hubert Gnaser, Rika Oki, Takaaki Aoki, Toshio Seki, Jiro Matsuo
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY   430 149-157   Jul 2018   [Refereed]
Toshio Seki, Hiroki Yamamoto, Takahiro Kozawa, Tadashi Shojo, Kunihiko Koike, Takaaki Aoki, Jiro Matsuo
JAPANESE JOURNAL OF APPLIED PHYSICS   56(6) 06HB02   Jun 2017   [Refereed]
T. Seki, H. Yamamoto, T. Kozawa, K. Koike, T. Aoki, J. Matsuo
APPLIED PHYSICS LETTERS   110(18) 182105   May 2017   [Refereed]
Takaaki Aoki, Toshio Seki, Jiro Matsuo
SURFACE & COATINGS TECHNOLOGY   306 63-68   Nov 2016   [Refereed]
K. Suzuki, M. Kusakari, M. Fujii, T. Seki, T. Aoki, J. Matsuo
SURFACE AND INTERFACE ANALYSIS   48(11) 1119-1121   Nov 2016   [Refereed]
Takaya Satoh, Hironobu Niimi, Naoki Kikuchi, Makiko Fujii, Toshio Seki, Jiro Matsuo
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY   404 1-7   Jun 2016   [Refereed]
Toshio Seki, Yu Yoshino, Takehiko Senoo, Kunihiko Koike, Takaaki Aoki, Jiro Matsuo
JAPANESE JOURNAL OF APPLIED PHYSICS   55(6) 06HB01   Jun 2016   [Refereed]
Hubert Gnaser, Masakazu Kusakari, Makiko Fujii, Toshio Seki, Takaaki Aoki, Jiro Matsuo
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B   34(3) 03H102   May 2016   [Refereed]
Masakazu Kusakari, Makiko Fujii, Toshio Seki, Takaaki Aoki, Jiro Matsuo
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B   34(3) 03H111   May 2016   [Refereed]
Toshio Seki, Masakazu Kusakari, Makiko Fujii, Takaaki Aoki, Jiro Matsuo
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS   371 189-193   Mar 2016   [Refereed]
Rie Shishido, Makiko Fujii, Toshio Seki, Takaaki Aoki, Jiro Matsuo, Shigeru Suzuki
RAPID COMMUNICATIONS IN MASS SPECTROMETRY   30(4) 476-482   Feb 2016   [Refereed]
Hiroki Yamamoto, Toshio Seki, Jiro Matsuo, Kunihiko Koike, Takahiro Kozawa
MICROELECTRONIC ENGINEERING   141 145-149   Jun 2015   [Refereed]
Masakazu Kusakari, Hubert Gnaser, Makiko Fujii, Toshio Seki, Takaaki Aoki, Jiro Matsuo
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY   383 31-37   May 2015   [Refereed]
Masato Suzuki, Masashi Nojima, Makiko Fujii, Toshio Seki, Jiro Matsuo
SURFACE AND INTERFACE ANALYSIS   47(2) 295-297   Feb 2015   [Refereed]
I. Yamada, J. Matsuo, N. Toyoda, T. Aoki, T. Seki
CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE   19(1) 12-18   Feb 2015   [Refereed]
Masato Suzuki, Masashi Nojima, Makiko Fujii, Toshio Seki, Jiro Matsuo
SURFACE AND INTERFACE ANALYSIS   47(2) 298-300   Feb 2015   [Refereed]
Toshio Seki, Makiko Fujii, Masakazu Kusakari, Shunichiro Nakagawa, Takaaki Aoki, Jiro Matsuo
Surface and Interface Analysis   46(12-13) 1133-1136   Dec 2014   [Refereed]
Makiko Fujii, Shunichirou Nakagawa, Toshio Seki, Takaaki Aoki, Jiro Matsuo
SURFACE AND INTERFACE ANALYSIS   46(12-13) 1129-1132   Dec 2014   [Refereed]
Masato Suzuki, Masashi Nojima, Makiko Fujii, Toshio Seki, Jiro Matsuo
SURFACE AND INTERFACE ANALYSIS   46(12-13) 1212-1214   Dec 2014   [Refereed]
Masashi Nojima, Masato Suzuki, Makiko Fujii, Toshio Seki, Jiro Matsuo
SURFACE AND INTERFACE ANALYSIS   46(S1) 368-371   Nov 2014   [Refereed]
Makiko Fujii, Masakazu Kusakari, Kazuhiro Matsuda, Naoki Man, Toshio Seki, Takaaki Aoki, Jiro Matsuo
SURFACE AND INTERFACE ANALYSIS   46(S1) 353-356   Nov 2014   [Refereed]
Toshio Seki, Yoshinobu Wakamatsu, Shunichiro Nakagawa, Takaaki Aoki, Akihiko Ishihara, Jiro Matsuo
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS   332 326-329   Aug 2014   [Refereed]
Jiro Matsuo, Souta Torii, Kazuki Yamauchi, Keisuke Wakamoto, Masakazu Kusakari, Shunichiro Nakagawa, Makiko Fujii, Takaaki Aoki, Toshio Seki
APPLIED PHYSICS EXPRESS   7(5) 056602   May 2014   [Refereed]
Masaki Hada, Dongfang Zhang, Kostyantyn Pichugin, Julian Hirscht, Micha A. Kochman, Stuart A. Hayes, Stephanie Manz, Regis Y. N. Gengler, Derek A. Wann, Toshio Seki, Gustavo Moriena, Carole A. Morrison, Jiro Matsuo, German Sciaini, R. J. Dwayne Miller
NATURE COMMUNICATIONS   5 3863   May 2014   [Refereed]
Makiko Fujii, Shunichirou Nakagawa, Kazuhiro Matsuda, Naoki Man, Toshio Seki, Takaaki Aoki, Jiro Matsuo
RAPID COMMUNICATIONS IN MASS SPECTROMETRY   28(8) 917-920   Apr 2014   [Refereed]
Hubert Gnaser, Makiko Fujii, Shunichirou Nakagawa, Toshio Seki, Takaaki Aoki, Jiro Matsuo
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY   360(1) 54-57   Mar 2014   [Refereed]
Removal of Ion implanted Poly vinyl phenol using Wet Ozone
Yousuke Goto, Yukihiro Angata, Masashi Yamamoto, Toshio Seki, Jiro Matsuo, Hideo Horibe
JOURNAL OF PHOTOPOLYMER SCIENCE AND TECHNOLOGY   26(4) 467-472   2013   [Refereed]
T. Seki, S. Shitomoto, S. Nakagawa, T. Aoki, J. Matsuo
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS   315 356-359   Nov 2013   [Refereed]
Kazuya Dobashi, Kensuke Inai, Misako Saito, Toshio Seki, Takaaki Aoki, Jiro Matsuo
IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING   26(3) 328-334   Aug 2013   [Refereed]
Hubert Gnaser, Makiko Fujii, Shunichirou Nakagawa, Toshio Seki, Takaaki Aoki, Jiro Matsuo
RAPID COMMUNICATIONS IN MASS SPECTROMETRY   27(13) 1490-1496   Jul 2013   [Refereed]
Takaaki Aoki, Toshio Seki, Jiro Matsuo
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS   303 170-173   May 2013   [Refereed]
Yasuyuki Yamamoto, Kazuya Ichiki, Toshio Seki, Takaaki Aoki, Jiro Matsuo
SURFACE AND INTERFACE ANALYSIS   45(1) 167-170   Jan 2013   [Refereed]
K. Ichiki, J. Tamura, T. Seki, T. Aoki, J. Matsuo
SURFACE AND INTERFACE ANALYSIS   45(1) 522-524   Jan 2013   [Refereed]
Takaaki Aoki, Toshio Seki, Jiro Matsuo
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS   282 29-32   Jul 2012   [Refereed]
J. Matsuo, K. Ichiki, Y. Yamamoto, T. Seki, T. Aoki
SURFACE AND INTERFACE ANALYSIS   44(6) 729-731   Jun 2012   [Refereed]
Masaki Hada, Sachi Ibuki, Yusaku Hontani, Yasuyuki Yamamoto, Kazuya Ichiki, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo
JOURNAL OF APPLIED PHYSICS   110(9) 094701   Nov 2011   [Refereed]
T. Seki, T. Aoki, J. Matsuo
SURFACE & COATINGS TECHNOLOGY   206(5) 789-791   Nov 2011   [Refereed]
Yoshinobu Wakamatsu, Hideaki Yamada, Satoshi Ninomiya, Brian N. Jones, Toshio Seki, Takaaki Aoki, Roger Webb, Jiro Matsuo
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS   269(20) 2251-2253   Oct 2011   [Refereed]
Takaaki Aoki, Toshio Seki, Jiro Matsuo
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS   269(14) 1582-1585   Jul 2011   [Refereed]
K. Ichiki, S. Ninomiya, Y. Nakata, H. Yamada, T. Seki, T. Aoki, J. Matsuo
SURFACE AND INTERFACE ANALYSIS   43(1-2) 120-122   Jan 2011   [Refereed]
Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada, Yoshihiko Nakata, Toshio Seki, Takaaki Aoki, Jiro Matsuo
SURFACE AND INTERFACE ANALYSIS   43(1-2) 221-224   Jan 2011   [Refereed]
Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada, Yoshihiko Nakata, Toshio Seki, Takaaki Aoki, Jiro Matsuo
SURFACE AND INTERFACE ANALYSIS   43(1-2) 95-98   Jan 2011   [Refereed]
Masaki Hada, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo
SURFACE AND INTERFACE ANALYSIS   43(1-2) 84-87   Jan 2011   [Refereed]
H. Yamada, Y. Nakata, S. Ninomiya, T. Seki, T. Aoki, J. Tamura, J. Matsuo
SURFACE AND INTERFACE ANALYSIS   43(1-2) 363-366   Jan 2011   [Refereed]
Masaki Hada, Sachi Ibuki, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo
JAPANESE JOURNAL OF APPLIED PHYSICS   49(3) 036503   2010   [Refereed]
Kunihiko Koike, Yu Yoshino, Takehiko Senoo, Toshio Seki, Satoshi Ninomiya, Takaaki Aoki, Jiro Matsuo
APPLIED PHYSICS EXPRESS   3(12) 126501   2010   [Refereed]
Sputtering Properties of Si by Size-Selected Ar Gas Cluster Ion Beam
K Ichiki, S Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo
Transactions of the Materials Research Society of Japan   35(4) 789-792   Dec 2010   [Refereed]
Processing Techniques of Biomaterials: Using Gas Cluster Ion Beam for Imaging Mass Spectrometry
H Yamada, K Ichiki, Y Nakata, S Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo
Transactions of the Materials Research Society of Japan   35(4) 793-796   Dec 2010   [Refereed]
SIMS Depth Profiling of Organic Materials with Ar Cluster Ion Beam
Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada, Yoshihiko Nakata, Toshio Seki, Takaaki Aoki, Jiro Matsuo
Transactions of the Materials Research Society of Japan   35(4) 785-788   Dec 2010   [Refereed]
Jiro Matsuo, Satoshi Ninomiya, Hideaki Yamada, Kazuya Ichiki, Yoshinobu Wakamatsu, Masaki Hada, Toshio Seki, Takaaki Aoki
SURFACE AND INTERFACE ANALYSIS   42(10-11) 1612-1615   Oct 2010   [Refereed]
Hideaki Yamada, Kazuya Ichiki, Yoshihiko Nakata, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS   268(11-12) 1736-1740   Jun 2010   [Refereed]
Takaaki Aoki, Toshio Seki, Jiro Matsuo
VACUUM   84(8) 994-998   Mar 2010   [Refereed]
Sputtering Yield Measurements with Size-selected Gas Cluster Ion Beams
Kazuya Ichiki, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo
MRS Symposium Proceedings   1181 DD13-DD25   2009   [Refereed]
Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada, Yoshihiko Nakata, Toshio Seki, Takaaki Aoki, Jiro Matsuo
RAPID COMMUNICATIONS IN MASS SPECTROMETRY   23(20) 3264-3268   Oct 2009   [Refereed]
Takaaki Aoki, Toshio Seki, Jiro Matsuo
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS   267(18) 2999-3001   Sep 2009   [Refereed]
Satoshi Ninomiya, Kazuya Ichiki, Toshio Seki, Takaaki Aoki, Jiro Matsuo
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS   267(16) 2601-2604   Aug 2009   [Refereed]
J. Matsuo, K. Ichiki, M. Hada, S. Ninomiya, T. Seki, T. Aoki, T. Nagayama, M. Tanjyo
Extended Abstracts of the 9th International Workshop on Junction Technology, IWJT 2009   84-85   Jun 2009   [Refereed]
Y. Nakata, H. Yamada, Y. Honda, S. Ninomiya, T. Seki, T. Aoki, J. Matsuo
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS   267(12-13) 2144-2148   Jun 2009   [Refereed]
Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada, Yoshihiko Nakata, Toshio Seki, Takaaki Aoki, Jiro Matsuo
RAPID COMMUNICATIONS IN MASS SPECTROMETRY   23(11) 1601-1606   Jun 2009   [Refereed]
Toshio Seki
Surface and Coatings Technology   203(17-18) 2446-2451   Jun 2009   [Refereed]
Takaaki Aoki, Toshio Seki, Satoshi Ninomiya, Kazuya Ichiki, Jiro Matsuo
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS   267(8-9) 1424-1427   May 2009   [Refereed]
T. Seki, T. Aoki, J. Matsuo
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS   267(8-9) 1444-1446   May 2009   [Refereed]
Low Damage Etching of Polymer Materials for Depth Profile Analysis Using Large Ar Cluster Ion Beam
Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada, Yoshihiko Nakata, Toshio Seki, Takaaki Aoki, Jiro Matsuo
Journal of Surface Analysis   15(3) 275-278   Feb 2009   [Refereed]
Hideaki Yamada, Kazuya Ichiki, Yoshihiko Nakata, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo
Journal of the Mass Spectrometry Society of Japan   57(3) 117-121   Jan 2009   [Refereed]
Yoshihiko Nakata, Yoshiro Honda, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo
JOURNAL OF MASS SPECTROMETRY   44(1) 128-136   Jan 2009   [Refereed]
High-Speed Nano-Processing with Cluster Ion Beams
Toshio Seki, Takaaki Aoki, Jiro Matsuo
Transactions of the MRS-J   33(4) 1019-1022   Dec 2008   [Refereed]
SIMS Analysis of Biological Mixtures with Fast Heavy Ion Irradiation
Yoshiro Honda, Yoshihiko Nakata, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo
Transactions of the MRS-J   33(4) 1039-1041   Dec 2008   [Refereed]
S NINOMIYA, K ICHIKI, Y NAKATA, Y HONDA, T SEKI, T AOKI, J MATSUO
Applied Surface Science   255(4) 880-882   Dec 2008   [Refereed]
T AOKI, T SEKI, S NINOMIYA, J MATSUO
Applied Surface Science   255(4) 944-947   Dec 2008   [Refereed]
K. Ichiki, S. Ninomiya, Y. Nakata, Y. Honda, T. Seki, T. Aoki, J. Matsuo
APPLIED SURFACE SCIENCE   255(4) 1148-1150   Dec 2008   [Refereed]
Y. Nakata, Y. Honda, S. Ninomiya, T. Seki, T. Aoki, J. Matsuo
APPLIED SURFACE SCIENCE   255(4) 1591-1594   Dec 2008   [Refereed]
Satoshi Ninomiya, Yoshihiko Nakata, Yoshiro Honda, Kazuya Ichiki, Toshio Seki, Takaaki Aoki, Jiro Matsuo
APPLIED SURFACE SCIENCE   255(4) 1588-1590   Dec 2008   [Refereed]
Low Damage Etching and SIMS Depth Profiling with Large Ar Cluster Ions
Satoshi Ninomiya, Jiro Matsuo, Kazuya Ichiki, Hideaki Yamada, Yoshihiko Nakata, Yoshiro Honda, Toshio Seki, Takaaki Aoki
Transactions of the MRS-J   33(4) 1043-1046   Dec 2008   [Refereed]
J MATSUO, S NINOMIYA, Y NAKATA, Y HONDA, K ICHIKI, T SEKI, T AOKI
Applied Surface Science   255(4) 1235-1238   Dec 2008   [Refereed]
Takeshi Hikata, Kazuhiko Hayashi, Tomoyuki Mizukoshi, Yoshiaki Sakurai, Itsuo Ishigami, Takaaki Aoki, Toshio Seki, Jiro Matsuo
Applied Physics Express   1 034002   Feb 2008   [Refereed]
The Effect of Incident Cluster Ion Size on Secondary Ion Yields Produced from Si
S Ninomiya, K Ichiki, Y Nakata, T Seki, T Aoki, Matsuo J
Transactions of the Materials Research Society of Japan   32(4) 895-898   Dec 2007   [Refereed]
S. Kakuta, S. Sasaki, K. Furusawa, T. Seki, T. Aoki, J. Matsuo
SURFACE & COATINGS TECHNOLOGY   201(19-20) 8632-8636   Aug 2007   [Refereed]
Toshio Seki, Jiro Matsuo
SURFACE & COATINGS TECHNOLOGY   201(19-20) 8646-8649   Aug 2007
T. Seki, J. Matsuo
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS   261(1-2) 647-650   Aug 2007
Takaaki Aoki, Toshio Seki, Satoshi Ninomiya, Jiro Matsuo
SURFACE & COATINGS TECHNOLOGY   201(19-20) 8427-8430   Aug 2007   [Refereed]
S. Kakuta, S. Sasaki, T. Hirano, K. Ueda, T. Seki, S. Ninomiya, M. Hada, J. Matsuo
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS   257 677-682   Apr 2007
H. Tokioka, H. Yamarin, T. Fujino, M. Inoue, T. Seki, J. Matsuo
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS   257 658-661   Apr 2007
T. Seki, J. Matsuo
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS   257 666-669   Apr 2007
Jiro Matsuo, Satoshi Ninomiya, Yoshihiko Nakata, Kazuya Ichiki, Takaaki Aoki, Toshio Seki
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS   257 627-631   Apr 2007   [Refereed]
A. Suzuki, E. Bourelle, A. Sato, T. Seki, J. Matsuo
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS   257 649-652   Apr 2007
K. Ichiki, S. Ninomiya, T. Seki, T. Aoki, J. Matsuo
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS   256(1) 350-353   Mar 2007   [Refereed]
Satoshi Ninomiya, Yoshihiko Nakata, Kazuya Ichiki, Toshio Seki, Takaaki Aoki, Jiro Matsuo
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS   256(1) 493-496   Mar 2007   [Refereed]
Satoshi Ninomiya, Kazuya Ichiki, Yoshihiko Nakata, Toshio Seki, Takaaki Aoki, Jiro Matsuo
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS   256(1) 528-531   Mar 2007   [Refereed]
Satoshi Ninomiya, Takaaki Aoki, Toshio Seki, Jiro Matsuo
APPLIED SURFACE SCIENCE   252(19) 6550-6553   Jul 2006   [Refereed]
Satoshi Ninomiya, Takaaki Aoki, Toshio Seki, Jiro Matsuo
APPLIED SURFACE SCIENCE   252(19) 7290-7292   Jul 2006   [Refereed]
GH Takaoka, H Noguchi, K Nakayama, T Seki, M Kawashita
REVIEW OF SCIENTIFIC INSTRUMENTS   77(3) 03B508   Mar 2006
AIP Conference Proceedings   214-217   Jan 2006   [Refereed]
T Seki, T Murase, J Matsuo
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS   242(1-2) 179-181   Jan 2006   [Refereed]
C Heck, T Seki, T Oosawa, M Chikamatsu, N Tanigaki, T Hiraga, J Matsuo
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS   242(1-2) 140-142   Jan 2006   [Refereed]
Organic electroluminescent device on ITO smoothed with Ar cluster ion beam
Claire Heck, Takeru Oosawa, Masayuki Chikamatsu, Nobu Tanigaki, Toshio Seki, Jiro Matsuo
Nonlinear Optics Quantum Optics   34(1-4) 255-258   2005   [Refereed]
E Bourelle, A Suzuki, A Sato, T Seki, J Matsuo
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS   241(1-4) 622-625   Dec 2005   [Refereed]
T Seki, J Matsuo
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS   241(1-4) 604-608   Dec 2005   [Refereed]
Toshio Seki, Jiro Matsuo
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms   237(1-2) 455-458   Aug 2005   [Refereed]
S KAKUTA, T SEKI, S SASAKI, K FURUSAWA, T AOKI, Jiro Matsuo
Surface and Coatings Technology   196(1-3) 198-202   Jun 2005   [Refereed]
Emmanuel Bourelle, Akiko Suzuki, Akinobu Sato, Toshio Seki, Jiro Matsuo
Japanese Journal of Applied Physics   43(No. 10A) L1253-L1255   Sep 2004   [Refereed]

Misc

 
Kazuya Ichiki, Satoshi Ninomiya, Toshio Seki, Takaaki Aoki, Jiro Matsuo
MRS Proceedings   1181 135-140   Jan 2011   [Refereed]
T. Aoki, T. Seki, J. Matsuo
IWJT-2010: Extended Abstracts - 2010 International Workshop on Junction Technology   114-115   May 2010   [Refereed]
T. Seki, Y. Yoshino, T. Senoo, K. Koike, S. Ninomiya, T. Aoki, J. Matsuo
AIP Conference Proceedings   1321(1) 317-320   2010   [Refereed]
M. Hada, Y. Hontani, S. Ibuki, K. Ichiki, S. Ninomiya, T. Seki, T. Aoki, J. Matsuo
AIP Conference Proceedings   1321(1) 314-316   2010   [Refereed]
Y. Yamamoto, K. Ichiki, S. Ninomiya, T. Seki, T. Aoki, J. Matsuo
AIP Conference Proceedings   1321(1) 298-301   2010   [Refereed]
K. Ichiki, S. Ninomiya, T. Seki, T. Aoki, J. Matsuo
AIP Conference Proceedings   1321(1) 294-297   2010   [Refereed]
Y. Wakamatsu, H. Yamada, S. Ninomiya, B.N. Jones, T. Seki, T. Aoki, R. Webb, J. Matsuo
AIP Conference Proceedings   1321(1) 233-236   2010   [Refereed]
T. Aoki, T. Seki, J. Matsuo
IWJT-2008 - Extended Abstracts 2008 International Workshop on Junction Technology   49-54   May 2008   [Refereed]
Toshio Seki, Takaaki Aoki, Jiro Matsuo
AIP Conference Proceedings   1066 423-426   Jan 2008   [Refereed]
T. Aoki, T. Seki, J. Matsuo
Extended Abstracts of the 7th International Workshop on Junction Technology, IWJT 2007   23-24   Jun 2007   [Refereed]
J. Matsuo, T. Aoki, T. Seki
Extended Abstracts of the 7th International Workshop on Junction Technology, IWJT 2007   53-54   Jun 2007   [Refereed]
Shigeru Kakuta, Shinji Sasaki, Kenji Furusawa, Toshio Seki, Takaaki Aoki, Jiro Matsuo
Mat. Res. Soc. Symp. Proceedings   843 183-188   Dec 2005   [Refereed]
High-speed Processing with Reactive Cluster Ion Beams
Toshio Seki, Jiro Matsuo
Mat. Res. Soc. Symp. Proceedings   843 251-256   Dec 2005   [Refereed]
Large Cluster Ions as Projectiles for SIMS-Opportunities and Challenges
Jiro Matsuo, Takaaki Aoki, Toshio Seki
Proceedings of 18th Annual Workshop on SIMS   29-32   May 2005   [Refereed]
High-speed Processing with Cluster Ion Beams
Toshio Seki, Jiro Matsuo
Mat. Res. Soc. Symp. Proceedings   792 593-598   Dec 2004   [Refereed]
Fast Neutral Ar Penetratio during Gas Cluster Ion Beam Irradiation into Magnetic Thin Films
Shigeru Kakuta, Toshio Seki, Shinji Sasaki, Kenji Furusawa, Takaaki Aoki, Jiro Matsuo
Mat. Res. Soc. Symp. Proceedings   792 599-604   Dec 2004   [Refereed]
Shigeru Kakuta, Toshio Seki, Shinji Sasaki, Kenji Furusawa, Takaaki Aoki, Jiro Matsuo
MRS Proceedings   792 R9.36.1-R9.36.6   2004   [Refereed]
XAFS study of thin films fabricated with cluster ion assisted deposition technique
Jiro Matsuo, Teruyuki Kitagawa, Yutaka Shimizugawa, Hiroyuki Kageyama, Kazuhiro Kanda, Toshio Seki, Takaaki Aoki, Shinji Matsui
Trans. Mat. Res. Soc. Jpn.   28 101-106   Dec 2003   [Refereed]
Toshio Seki, Jiro Matsuo, Gikan H. Takaoka
AIP Conference Proceedings   680 715-718   Aug 2003   [Refereed]
Takaaki Aoki, Toshio Seki, Atsuko Nakai, Jiro Matsuo, Gikan H. Takaoka
AIP Conference Proceedings   680 741-744   Aug 2003   [Refereed]
Threshold Enrgy for Generationg Damage with Cluster Ion Irradiation
Toshio Seki, Atsuko Nakai, Jiro Matsuo, Gikan H. Takaoka
Mat. Res. Soc. Symp. Proceedings   749 335-340   Jan 2003   [Refereed]
Cluster Size Effect on Surface Modification Process using Cluster Ion Beam
Takaaki Aoki, Toshio Seki, Atsuko Nakai, Jiro Matsuo, Gikan H. Takaoka
Trans. Mat. Res. Soc. Jpn.   28(2) 485-488   Jan 2003   [Refereed]
Toshio Seki, Jiro Matsuo, Gikan H. Takaoka
Proceedings of the 14th International Conference on Implantation Technology 2002   673-676   Sep 2002   [Refereed]
T. Seki, T. Aoki, A. Nakai, J. Matsuo, G.H. Takaoka
Materials Research Society Symposium - Proceedings   749 335-340   2002   [Refereed]
Chemical Reaction of Cluster Ion Beam with Surfaces
高岡 義寛, 瀬木 利夫, 松尾 二郎
Proceedings of the 12th Symposium on Beam Engineering of Advanced Material Syntheses   61-64   Nov 2001   [Refereed]
Toshio Seki, Takaaki Tsumura, Takaaki Aoki, Jiro Matsuo, Gikan H. Takaoka, Isao Yamada
Mat. Res. Soc. Symp. Proceedings   647 O9.4.1-O9.4.6   2001   [Refereed]
Toshio Seki, Jiro Matsuo, Gikan H. Takaoka, Isao Yamada
AIP Conference Proceedings   576 1003-1006   2001   [Refereed]
Effects of ion irradiation on Ge film formed on Si(111)
瀬木 利夫, 津村 一道, 松尾 二郎, 高岡 義寛
Proceedings of the 11th Symposium on Beam Engineering of Advanced Material Syntheses   41-44   Nov 2000
Toshio Seki, Jiro Matsuo, Isao Yamada
1998 International Conference on Ion Implantation Technology. Proceedings   1262-1265   Dec 1999   [Refereed]
Jiro Matsuo, Noriaki Toyoda, Masahiro Saito, Takaaki Aoki, Toshio Seki, Isao Yamada
AIP Conference Proceedings   475 429-432   Jan 1999   [Refereed]
Toshio Seki, M. Tanomura, Takaaki Aoki, Jiro Matsuo, I. Yamada
Materials Research Society Symposium - Proceedings   504 93-98   1999   [Refereed]
Takaaki Aoki, Toshio Seki, Masahiro Tanomura, Jiro Matsuo, Zinetulla Insepov, Isao Yamada
Mat. Res. Soc. Symp. Proceedings   504 81-86   1998   [Refereed]
Size Dependence of Bombardment Characteristics Produced by Cluster Ion Beam
Toshio Seki, Masahiro Tanomura, Takaaki Aoki, Jiro Matsuo, Isao Yamada
Mat. Res. Soc. Symp. Proceedings   504 93-98   1998   [Refereed]

Conference Activities & Talks

 
Ambient Secondary Ion Mass Analysis with MeV-energy Heavy Ion [Invited]
T.Seki, K. Ishii, M. Kusakari, T. Aoki and J. Matsuo
11th International Symposium on Atomic Level Characterizations for New Materials and Devices ’17 (ALC`17)   4 Dec 2017   
Fabrication of 3D structure by double-angled etching with reactive gas cluster injection
T. Seki, H. Yamamoto, T. Kozawa, T. Shojo, K. Koike, T. Aoki and J. Matsuo
The 39th International Symposium on Dry Process(DPS2017)   16 Nov 2017   
Characterization of Bio-Molecules with GCIBSIMS equipped with MS/MS Spectrometer
Jiro Matsuo, T. Seki and T. Aoki
AVS 64th International Symposium & Exhibition 2017 (AVS64)   29 Oct 2017   
Organic Material Analysis with a SIMS System with Q-TOF MS/MS Technique
J. Matsuo, L. Houssiau, H. Gnaser, T. Seki1 and T. Aoki
The 8th International Symposium on Surface Science (ISSS-8)   22 Oct 2017   
Ambient SIMS using MeV-Energy Heavy Ion
T.Seki, K. Ishii, M. Kusakari, T. Aoki and J. Matsuo
The 23rd International Conference on Ion Beam Analysis (IBA-2017)   9 Oct 2017   
Observation of Adsorption and Desorption of Water Molecules with Ambient SIMS
J.Matsuo, T.Seki and T.Aoki
21st International Conference on Secondary Ion Mass Spectrometry (SIMS21)   10 Sep 2017   
SIMS Measurement in Ambient and Humid Condition
K. Ishii, T. Seki, T. Aoki and J. Matsuo
The 15th International Conference on Advanced Materials (IUMRS-ICAM 2017)   28 Aug 2017   
Angled Etching by ClF3?Ar Gas Cluster Injection
T. Seki, H. Yamamoto, T. Kozawa, T. Shojo, K. Koike, T. Aoki and J. Matsuo
The 15th International Conference on Advanced Materials (IUMRS-ICAM 2017)   28 Aug 2017   
Observation of Adsorption and Desorption of Water Molecules in the Ambient with Swift Heavy Ions
Jiro Matsuo, M. Kusakari, T. Seki and T. Aoki
Symposium on Surface and Nano Science 2017 (SNNS2017)   1 Jan 2017   
Study of Large Cluster Impact for Surface Modification Process
T. Aoki, T. Seki and J. Matsuo
Conference of 2016 MRS Fall Meeting (Symposium PM1)   29 Nov 2016   
High Aspect Ratio Patterning by Using ClF3-Ar Neutral Cluster Etching
H. Yamamoto, T. Seki, J. Matsuo, K. Koike and T. Kozawa
The 38th International Symposium on Dry Process(DPS2016)   22 Nov 2016   
Oblique pattern etching with ClF3-Ar neutral cluster beam
T. Seki, H. Yamamoto, T. Kozawa, T. Shojo, K. Koike, T. Aoki and J. Matsuo
The 38th International Symposium on Dry Process(DPS2016)   21 Nov 2016   
Oblique pattern etching with ClF3-Ar neutral cluster beam
T. Seki, H. Yamamoto, T. Kozawa, T. Shojo, K. Koike, T. Aoki and J. Matsuo
9th International Meeting on Recent Developments in the Study of Radiation Effects in Matter REM 9   26 Oct 2016   
Cluster Ion Beams for Organic Semiconductors and Biological Materials
J. Matsuo, K. Suzuki,M. Kusakari, T. Seki and T. Aoki
21th International Conference on Ion Implantation Technology IIT2016   26 Sep 2016   
Ambient analysis using a MeV ion probe: measurement of liquid and solid states of benzoic acid
M.Kusakari, M.Fujii, T.Seki, T.Aoki and J.Matsuo
15th International Conference on Nuclear Microprobe Technology and Applications ICNMTA 2016   1 Aug 2016   
A new approach of interface analysis: measurement of benzoic acid in solution using ambient SIMS
M. Kusakari, M. Fujii, T. Seki, T. Aoki and J. Matsuo
The Scientific International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-18)   22 Jul 2016   
Development of New Cluster-SIMS Instrument Combined with Tandem Mass
K. Suzuki, M. Kusakari, T. Seki, T. Aoki, and J. Matsuo
The Scientific International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-18)   22 Jul 2016   
Chemical Structurer Determination with MS/MS SIMS for Biological Molecules
J. Matsuo, K. Suzuki, M. Kusakari, T. Seki and T. Aoki
The Scientific International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-18)   21 Jul 2016   
Chemical analysis under ambient conditions using swift heavy ion beams
J.Matsuo,M.Kusakari,M.Fujii,T.Seki and T.Aoki
12th European Conference on Acceleratorsin Applied Research and Technology   7 Jul 2016   
Reactive etching with ClF3-Ar neutral cluster beam
T. Seki, Y. Yoshino, T. Senoo, K. Koike, T. Aoki and J. Matsuo
The 37th International Symposium on Dry Process(DPS2015)   5 Nov 2015   
Solid-Liquid Interface Analysis with MeV-Energy Heavy Ion Beams
T.Seki, M. Kusakari, M. Fujii, T. Aoki and J. Matsuo
ALC'15 10th International Symposium on Atomic Level Characterizations for New Materials and Devices '15   28 Oct 2015   
Evaluation on organic analysis with a novel SIMS apparatus using model standard sam ples
M.Fujii, T. Seki, T. Aoki and J. Matsuo
ALC'15 10th International Symposium on Atomic Level Characterizations for New Materials and Devices '15   27 Oct 2015   
Development of Low-Pressure SIMS Instruments with Large Cluster Ion Beam
K.Suzuki, M. Kusakari, M. Fujii, T. Seki, T. Aoki and J. Matsuo
ALC'15 10th International Symposium on Atomic Level Characterizations for New Materials and Devices '15   27 Oct 2015   
Comparative Study of Dual and Single Beam Analysis Techniques for Biological Materials
A.Karen, M. Fujii, T. Seki, T. Aoki and J. Matsuo
SIMS XX 20th International Conference on Secondary Ion Mass Spectrometry   17 Sep 2015   
Influences of Yield and Damage Cross-Section on Imaging Analysis of Organic Molecules by Bi cluster TOF-SIMS
R. Shishido, M. Fujii, T. Seki, T. Aoki, J. Matsuo, S. Suzuki
SIMS XX 20th International Conference on Secondary Ion Mass Spectrometry   17 Sep 2015   
Current Prospects of Organic Analysis with Ar-GCIB SIMS from Synthetic Polymers and Organic Devices toward BiologicalMaterials
M. Fujii, T. Seki, T. Aoki and J. Matsuo
SIMS XX 20th International Conference on Secondary Ion Mass Spectrometry   14 Sep 2015   
Molecular Cluster Emission in Sputtering of Amino Acids by Argon Gas-cluster Ions
Hubert Gnaser, M. Kusakari, M. Fujii, T. Seki, T. Aoki and J. Matsuo
SIMS XX 20th International Conference on Secondary Ion Mass Spectrometry   14 Sep 2015   
Development of Ambient SIMS using MeV-energy ion probe
M. Kusakari, M. Fujii, T. Seki, T. Aokia and J. Matsuo
SIMS XX 20th International Conference on Secondary Ion Mass Spectrometry   14 Sep 2015   
Imaging mass spectrometry with MeV-energy heavy ion beams [Invited]
T. Seki, T. Aoki, A. Ishihara and J. Matsuo
XXII INTERNATIONAL CONFERENCE ON ION - SURFACE INTERACTIONS (ISI-2015)   21 Aug 2015   
Recent Progress and Future Prospects of Cluster SIMS for Biological Applications
M. Fujii, T. Seki ,T. Aoki, J. Matsuo
SISS-17 Satellite workshop   29 Jun 2015   
Comparative Study of Cluster SIMS and Other Techniques for Highly Accurate Organic Analysis
M. Fujii, R. Shishido, T. Satoh, T. Seki, T. Aoki, S. Suzuki and J. Matsuo
SISS-17   25 Jun 2015   
The Effect of Yield and Damage Cross-Section on Imaging Analysis of OrganicMaterials by Different Primary Bi Ions in TOF-SIMS
R. Shishido, M. Fujii, T. Seki, T. Aoki, J. Matsuo and S. Suzuki
SISS-17   25 Jun 2015   
A New Ambient Analysis using MeV-SIMS for Liquid-Solid Interface
M. Kusakari, M. Fujii, T. Seki, T. Aoki and J. Matsuo
SISS-17   25 Jun 2015   
Development of SIMS instruments with Focused Cluster Ion Beam Toward New Applications
K. Suzuki, M. Kusakari, M. Fujii, T. Seki, T. Aoki, and J. Matsuo
SISS-17   25 Jun 2015   
Ambient Analysis of Liquid Materials with Wet-SIMS
T.Seki, M.Kusakari, M.Fujii, T.Aoki and JMatsuo
22nd International Conference on Ion Beam Analysis (IBA 2015)   14 Jun 2015   
The laser desorption/ionization imaging mass spectrometry for synthetic polymer analysis assisted by metal nano-particles
T.Satoh, H,.Niimi, M. Fujii, T. Seki, J.Matsuo, M.Ubukata and R.DiPasquale
ASMS   3 Jun 2015   
Etching reactions of magnetic materials by CO cluster beams
K. Karahashi, T. Seki, J. Matsuo, S. Hamaguchi
The 36th International Symposium on Dry Process (DPS2014)   27 Nov 2014   
Imaging mass spectrometry for the organic thin film using laser desorption ionization
T. Satoh, M. Shima, H. Niimi, Y. Nakajima, M. Fujii, T. Seki and J. Matsuo
The 7th International Symposium on Surface Science (ISSS-7)   4 Nov 2014   
Recent Progress in Cluster Beam -- from Semiconductor to Soft Materials
J. Matsuo, T. Seki, T. Aoki, M. Fujii
The 19th International Conference on Ion Beam Modification of Materials (IBMM 2014)   17 Sep 2014   
Imaging mass spectrometry and depth profiling for organic thin films using laser desorption ionization
T. Satoh, M. Shima, H. Niimi, Y. Nakajima, M. Fujii, T. Seki, J. Matsuo
18th International Microscopy Congress (IMC2014)   10 Sep 2014   
Highly Accurate Biological Analysis using Ar-GCIB SIMS with Chemical Assist Ionization
M. Fujii, S. Nakagawa, T. Seki, T. Aoki, J. Matsuo
The 15th IUMRS-International Conference in Asia (IUMRS-ICA 2014)   25 Aug 2014   
Molecular Dynamics Simulation of Gas Cluster Impact on Coner-shaped Target
T. Aoki, T. Seki, J. Matsuo
The 15th IUMRS-International Conference in Asia (IUMRS-ICA 2014)   25 Aug 2014   
MeV-SIMS with swift heavy ions at low pressure [Invited]
J. Matsuo, M. Kusakari, M. Fujii, T. Seki and T. Aoki
14th International Conference on Nuclear Microprobe Technology and Applications   8 Jul 2014   
High Resolution Imaging Mass with Focused Ar Cluster Beam
J. Matsuo, S. Torii, K. Yamauchi, K. Wakamoto, M. Kusakari, S. Nakagawa, M. Fujii, T. Aoki and T. Seki
The 16th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS16)   20 Jun 2014   
Organic Materials Analysis Using Different Primary Bi Ions in TOF-SIMS
R. Shishido, M. Fujii, T. Seki, T. Aoki, J. Matsuo and S. Suzuki
The 16th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS16)   19 Jun 2014   
Highly Sensitive Lipid Analysis and Imaging Mass Spectrometry with Cluster SIMS Apparatus
M. Fujii, R. Shishido, S. Torii, S. Nakagawa, T. Seki, T. Aoki, S. Suzuki and J. Matsuo
The 16th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS16)   19 Jun 2014   
Possibilities and Limitations of Biological Analysis with novel Ar-GCIB SIMS Apparatus
M. Fujii, S. Nakagawa, T. Seki, T. Aoki and J. Matsuo
The 16th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS16)   19 Jun 2014   
Imaging mass spectrometry and depth profiling for the organic thin film using laser desorption ionization
T. Satoh, M. Shima, H. Niimi, Y. Nakajima, M. Fujii, T. Seki, J. Matsuo, R. DiPasquale
62nd ASMS Conference on Mass Spectrometry and Allied Topics   16 Jun 2014   
Possibilities and Limitations of MeV-SIMS for Biological Applications [Invited]
M. Fujii, M. Kusakari, T. Seki, T. Aoki and J. Matsuo
The Conference on Application of Accelerators in Research and Industry (CAARI2014)   26 May 2014   
Lipid Compounds Analysis with Argon Gas Cluster Ion Beam Irradiation
M. Fujii, S. Nakagawa, T. Seki, T. Aoki and J. Matsuo
The Conference on Application of Accelerators in Research and Industry (CAARI2014)   26 May 2014   
Computer simulation of cluster impact on soft- and hard- material interface
T. Aoki, T. Seki and J. Matsuo
23rd Annual Meeting of MRS-J   9 Dec 2013   
Lipid Compounds Analysis with Swift Heavy Ion Beam for Biological Applications
M. Fujii, M. Kusakari, T. Seki, T. Aoki and J. Matsuo
23rd Annual Meeting of MRS-J   9 Dec 2013   
Low Vacuum SIMS Measurements of Higher Alcohols with MeV-energy Heavy Ion Beam
M. Kusakari, M. Fujii, T. Seki, T. Aoki and J. Matsuo
23rd Annual Meeting of MRS-J   9 Dec 2013   
Si Etching with ClF3 Neutral Cluster Beam from Multi-nozzle
T. Seki, Y. Yoshino, T. Senoo, K. Koike, T. Aoki and J. Matsuo
23rd Annual Meeting of MRS-J   9 Dec 2013   
Mass Analysis by Ar-GCIB-Dynamic SIMS for Organic Materials
M. Suzuki, M. Nojima, M. Fujii, T. Seki and J. Matsuo
9th International Symposium on Atomic Level Characterizations for New Materials and Devices ’13   2 Dec 2013   
Quantitative Analysis of Lipids with Ar Cluster Ion Beam
M. Fujii, S. Nakagawa, T. Seki, T. Aoki and J. Matsuo
9th International Symposium on Atomic Level Characterizations for New Materials and Devices ’13   2 Dec 2013   
Ambient Analysis with Wet-SIMS
T. Seki, M. Fujii, S. Nakagawa, T. Aoki and J. Matsuo
9th International Symposium on Atomic Level Characterizations for New Materials and Devices ’13   2 Dec 2013   
Analysis of Liquid Materials with Wet-SIMS
T. Seki, M. Fujii, M. Kusakari, S. Nakagawa, T. Aoki and J. Matsuo
Workshop on Strategic Japanese-Croatian Cooperative Program on Material Science   13 Nov 2013   
Possibilities and Limitations of Ar GCIB SIMS for Biological Applications
M. Fujii, S. Nakagawa, T. Seki, T. Aoki and J. Matsuo
19th International Conference on Secondary Ion Mass Spectrometry   3 Oct 2013   
Liquid Sample Measurements using Wet SIMS Apparatus with Swift Heavy Ion Beam
M. Fujii, M. Kusakari, T. Seki, T. Aoki and J. Matsuo
19th International Conference on Secondary Ion Mass Spectrometry   3 Oct 2013   
Development of organic depth profiling system with Ar-GCIB and IMS-4f
M. Nojima, M. Suzuki, M. Fujii, T. Seki and J. Matsuo
19th International Conference on Secondary Ion Mass Spectrometry   1 Oct 2013   
Generation of Ar cluster ion beam for high spatial resolution SIMS
S. Torii, T. Seki, T. Aoki and J. Matsuo
19th International Conference on Secondary Ion Mass Spectrometry   1 Oct 2013   
Secondary Ion Mass Spectrometry with Methanol Gas Cluster Ion Beam Irradiation
S. Nakagawa, T. Seki, T. Aoki and J. Matsuo
19th International Conference on Secondary Ion Mass Spectrometry   1 Oct 2013   
Depth analysis of DSPC by SIMS using gas cluster ion beam
S. Nakagawa, T. Seki, T. Aoki and J. Matsuo
19th International Conference on Secondary Ion Mass Spectrometry   1 Oct 2013   
Sputtered Ion Emission from Peptides and Amino Acids under Large Argon Cluster Ion Bombardment
H. Gnaser, M. Fujii, S. Nakagawa, T. Seki, T. Aoki and J. Matsuo
19th International Conference on Secondary Ion Mass Spectrometry   1 Oct 2013   
Chemical Reaction on the Specimen Surface by Cluster Ion Beam Irradiation
M. Fujii, T. Seki, T. Aoki and J. Matsuo
2013 JSAP-MRS Joint Symposia   19 Sep 2013   
Bio-imaging with MeV-energy Heavy Ion Beams [Invited]
T. Seki, S. Shitomoto, S. Nakagawa, T. Aoki and J. Matsuo
21st International Conference on Ion Beam Analysis   23 Jun 2013   
Development of MeV-SIMS Imaging System with Electrostatic Quadrupole Lens
T. Seki, S. Shitomoto, S. Nakagawa, T. Aoki and J. Matsuo
15th Scientific International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions   25 Apr 2013   
An Electrostatic Quadrupole Lens for Focusing Swift Heavy Ions in MeV-SIMS
T. Seki, S. Shitomoto, S. Nakagawa, T. Aoki and J. Matsuo
25th International Conference on Atomic Collisions in Solids   23 Oct 2012   
Ultrafast Molecule Dymanics of Photochromic Reaction in Diarylethene
Y. Hontani, M. Hada, T. Aoki, T. Seki and J. Matsuo
IUMRS-International Conference on Electronic Materials (IUMRS-ICEM 2012)   23 Sep 2012   
Photoinduced Ultrafast Phase Transition in VO2 Crystal: Atomic Motion of Vanadium
J. Matsuo, M. Hada, Y. Hontani, T. Seki and T. Aoki
IUMRS-International Conference on Electronic Materials (IUMRS-ICEM 2012)   23 Sep 2012   
Etching of Si by Methanol Gas Cluster Ion Beam Irradiation
S. Nakagawa, T. Seki, T. Aoki, and J. Matsuo
IUMRS-International Conference on Electronic Materials (IUMRS-ICEM 2012)   23 Sep 2012   
Development of Electrostatic Quadrupole Lens for MeV-SIMS Imaging
S. Shitomoto, T. Seki, T. Aoki, and J. Matsuo
IUMRS-International Conference on Electronic Materials (IUMRS-ICEM 2012)   23 Sep 2012   
High-speed Processing with ClF3 Cluster Injection
T. Seki, Y. Yoshino, T. Senoo, K. Koike, T. Aoki, and J. Matsuo
IUMRS-International Conference on Electronic Materials (IUMRS-ICEM 2012)   23 Sep 2012   
Development of Electrostatic Quadrupole Lens for MeV-SIMS Imaging
S. Shitomoto, T. Seki, T. Aoki and J. Matsuo
19th International Mass Spectrometry Conference   15 Sep 2012   
Secondary Ion Emission with Methanol Gas Cluster Ion Beam Irradiation
S. Nakagawa, T. Seki, T. Aoki and J. Matsuo
19th International Mass Spectrometry Conference   15 Sep 2012   
Molecular Imaging of Cells and Tissues with Continuous Cluster Ion Beams
J. Matsuo, T. Aoki and T. Seki
19th International Mass Spectrometry Conference   15 Sep 2012   
Bio-imaging with Swift Heavy Ion Beams
T. Seki, S. Shitomoto, S. Nakagawa, T. Aoki and J. Matsuo
19th International Mass Spectrometry Conference   15 Sep 2012   
Molecular Imaging with Focused Cluster Ion Beams [Invited]
J. Matsuo, S. Nakagawa, M. Py, T. Aoki and T. Seki
22th International Conference on the Application of Accelerators in Research & Industry   5 Aug 2012   
Development of MeV-SIMS imaging system with Electrostatic Quadrupole Lens [Invited]
T. Seki, S. Shitomoto, S. Nakagawa, T. Aoki and J. Matsuo
22th International Conference on the Application of Accelerators in Research & Industry   5 Aug 2012   
An Electrostatic Quadrupole Lens for Focusing Swift Heavy Ions in MeV-SIMS
T. Seki, S. Shitomoto, S. Nakagawa, T. Aoki and J. Matsuo
13th International Conference On Nuclear Microprobe Technology & Applications (ICNMTA2012)   26 Jul 2012   
MeV-SIMS with Swift Heavy Ion Beams toward Molecular
J. Matsuo, S. Shitomoto, S. Nakagawa, T. Aoki and T. Seki
13th International Conference On Nuclear Microprobe Technology & Applications (ICNMTA2012)   24 Jul 2012   
Evaluation of sputtering and damage with huge cluster impact using molecular dynamics simulations
T. Aoki, T. Seki and J. Matsuo
Computer Simulations of Radiation Effects in Solids (COSIRES2012)   26 Jun 2012   
Large-scale MD Simulation of Huge Cluster Impact for Surface Process and Analysis [Invited]
T. Aoki, T. Seki and J. Matsuo
The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions at Seikei University (SISS-14)   1 Jun 2012   
An Electrostatic Quadrupole Lens for Focusing Swift Heavy Ions in MeV-SIMS
T. Seki, S. Shitomoto, S. Nakagawa, T. Aoki and J. Matsuo
The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions at Seikei University (SISS-14)   1 Jun 2012   
Boron concentration measurement in cultivated cells with Nano-SIMS
M. Py, M. Takeuchi, T. Seki, T. Aoki and J. Matsuo
The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions at Seikei University (SISS-14)   31 May 2012   
Mass Imaging with Cluster Ion Beams
J. Matsuo, S. Nakagawa, M. Py. K. Ichiki, T. Aoki and T. Seki
The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions at Seikei University (SISS-14)   31 May 2012   
A Novel Imaging Technique for Cells and Tissue by Energetic Particle Bombardment
J. Matsuo, K. Ichiki, T. Aoki and T. Seki
2012 MRS Spring Meeting   11 Apr 2012   
Real-time Observation of Photo-induced Phase Transition of Diarylethene
Y. Hontani, M. Hada, T. Seki, T. Aoki and J. Matsuo
2012 MRS Spring Meeting   10 Apr 2012   
Time-resolved Observation of the Photoinduced Phase Transition of Diarylethene
Y. Hontani, M. Hada, T. Seki, T. Aoki and J. Matsuo
Banff Meeting on Structural Dynamics Ultrafast Dynamics with Xrays and Electrons   19 Feb 2012   
Large-Scale Molecular Dynamics Simulation of Huge Fluorine Cluster Impact on Silicon
T. Aoki, T. Seki and J. Matsuo
21th MRS-J Symposium(International Session)   20 Dec 2011   
Development of Electrostatic Quadrupole Lens for Focusing of Swift Heavy Ion
S. Shitomoto, Y. Wakamatsu, T. Seki, T. Aoki and J. Matsuo
21th MRS-J Symposium(International Session)   20 Dec 2011   
Cluster Beam Generation of Low Vapor Pressure Materials
T. Seki, Y. Yoshino, T. Senoo, K. Koike, T. Aoki and J. Matsuo
21th MRS-J Symposium(International Session)   20 Dec 2011   
Depth Profiling Technique and Molecular Imaging with Cluster SIMS -from Organic Thin Films and Single Cells -
J. Matsuo, K. Ichiki, S. Nakagawa, T. Seki and T. Aoki
21th MRS-J Symposium(International Session)   19 Dec 2011   
The Effect of Size Variation in Sputtering with Size-Selected Cluster Ion Beams
T. Seki, K. Ichiki, J. Tamura, T. Aoki and J. Matsuo
11th Workshop on Cluster Ion Beam Technology   5 Dec 2011   
Characteristics of Si Etching Using ClF3-Ar Cluster Beam
Y. Yoshino, T. Seki, T. Senoo, K. Koike, G. Inoue, T. Aoki and J. Matsuo
11th Workshop on Cluster Ion Beam Technology   5 Dec 2011   
Molecular dynamics simulations of large fluorine cluster impact on silicon with supersonic velocity
T. Aoki, T. Seki and J. Matsuo
11th Workshop on Cluster Ion Beam Technology   5 Dec 2011   
Molecular Imaging of Cells and Tissues with Novel Ion Beams
J. Matsuo, K. Ichiki, T. Yamanobe, Y. Yamamoto, T. Aoki and T. Seki
AVS 58th International Symposium   2 Nov 2011   
The effect of size variation in sputtering with size-selected cluster ion beams
J. Matsuo, K. Ichiki, T. Seki and T. Aoki
18th International Conference on Secondary Ion Mass Spectrometry (SIMS XVIII)   23 Sep 2011   
A focused Ar cluster ion beam for molecular imaging
J. Matsuo, K. Ichiki, T. Yamanbe, Y. Yamamoto, T. Seki and T. Aoki
18th International Conference on Secondary Ion Mass Spectrometry (SIMS XVIII)   23 Sep 2011   

Association Memberships

 
 

Research Grants & Projects

 
Study of nano-structural cluster ion beam generation technology
Grant-in-Aid for Scientific Research
Project Year: 2006 - 2008
Ministry of Education, Culture, Sports, Science and Technology: Grants-in-Aid for Scientific Research(若手研究(A))
Project Year: 2006 - 2008    Investigator(s): Toshio SEKI