論文

査読有り
2004年2月

Surface smoothing with large current cluster ion beam

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
  • T Seki
  • ,
  • J Matsuo

216
開始ページ
191
終了ページ
195
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1016/j.nimb.2003.11.078
出版者・発行元
ELSEVIER SCIENCE BV

A cluster is an aggregate of a few to several thousands atoms. When many atoms constituting a cluster ion bombard a local area, high-density energy deposition and multiple-collision processes are realized. Because of the interactions, cluster ion beam processes can produce new surface modification effects, such as surface smoothing, high rate sputtering and very shallow implantation. Especially, the cluster ion beam can smooth surfaces of diamond films that are very hard materials and difficult to machining with usual ion processes. High ion dose is needed to realize the nano-level smoothing and etching of hard materials using cluster ion beam and large current is needed to increase the productivity of processing. In order to achieve large current cluster ion beam, the cluster generation was studied and the beam current reached 600 muA. The size distributions of large current Ar cluster ion beams were measured using compact time-of-flight (TOF) system. A surface of diamond film could be smoothed with the large current cluster ion beam and the surface roughness (R-a) became 5.1 nm from 32 nm. (C) 2003 Elsevier B.V. All rights reserved.

リンク情報
DOI
https://doi.org/10.1016/j.nimb.2003.11.078
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000189222100032&DestApp=WOS_CPL
ID情報
  • DOI : 10.1016/j.nimb.2003.11.078
  • ISSN : 0168-583X
  • Web of Science ID : WOS:000189222100032

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