Kik Alfred

J-GLOBAL         Last updated: Apr 4, 2018 at 11:52
Kik Alfred
Tokyo Metropolitan University
Faculty of Systems Design, Department of Electrical Engineering and Computer Science
Job title
Assistant Professor
Dr. Eng.(Tokyo Institute of Technology)


Alfred Kik was born in Rayak, Lebanon. He received the Diplôme d’Ingénieur degree in electrical engineering from Lebanese University, Roumieh, Lebanon, in 2001, the Mastère Spécialisé degree from the École Nationale Supérieure des Télécommunications, Paris, France, in 2004, and the Dr.Eng. degree in electrical and electronic engineering from the Tokyo Institute of Technology, Tokyo, Japan, in 2012.
From 2001 to 2002, he was an RF Field Engineer with Transnet S.A.L., Homs, Syria. From 2005 to 2007, he was a Guest Researcher with the National Institute of Standards and Technology, Gaithersburg, MD, USA. He was involved in evaluating localization techniques for emergency applications and UWB indoor channel modeling. Since 2012, he has been an Assistant Professor with the Tokyo Metropolitan University, Tokyo, currently working at the Department of Electrical Engineering and Computer Science. His current research interests include VNA calibration algorithms, the microwave characterization of materials, and modeling of electromagnetic wave problems.

Academic & Professional Experience

Assistant Professor, Department of Electrical Engineering and Computer Science, Tokyo Metropolitan University
Assistant Professor, Department of Electrical and Electronic engineering, Tokyo Metropolitan University
Guest Researcher, National Institute of Standards and Technology (NIST、USA)
RF field Engineer, Transnet SAL (Syria)


PhD, Electrical and Electronic Engineering, Tokyo Institute of Technology
Mastere specialsé, Comelec, Telecom Paris Tech
Engineering degree, Electrical engineering, Lebanese University, Faculty of Engineering 2

Published Papers

Kik Alfred
IEEE Transaction on Microwave Theory and Techniques   64(11) 3878-3886   Nov 2016   [Refereed]
A new cavity-based method to measure the complex permittivity of dielectric materials is presented here. The method uses a double-ridged waveguide for the cavity instead of the widely used rectangular waveguides, thus enhancing the operational fre...
Alfred Kik, Atsuhiro Nishikata
IEICE Transactions on Electronics   99-C(1) 52-60   Jan 2016   [Refereed]
We propose a new swept-frequency measurement method for the electromagnetic characterization of materials. The material is a multilayer cylinder that pierces a rectangular waveguide through two holes in the narrow waveguide walls. The complex perm...
Alfred Kik, Atsuhiro Nishikata
IEICE Communication Express,   3(98) 258-262   Aug 2014   [Refereed]
We present a new approach for the broadband characterization of dielectric materials in the waveguide-penetration method. The new approach uses only two sets of uncalibrated S-parameter measurements: when the dielectric material is loaded into the...
Alfred Kik, Atsuhiro Nishikata
IEICE Communication Express   2(09) 383-388   Sep 2013   [Refereed]
Measurement error is an important factor in evaluating the reliability of a measurement method. In a previous paper, we proposed a new method that measures the permittivity and permeability of materials: a cylindrical material is placed perpendicu...
Alfred Kik, Atsuhiro Nishikata
IEICE Transactions on Electronics   95-C(7) 1211-1221   Jul 2012   [Refereed]
In this paper, a new swept-frequency method for the measurement of the complex permittivity and permeability of materials is proposed. The method is based on the S-parameters measurement of a cylindrical material placed inside a rectangular wavegu...
In-vivo measurement of equivalent complex permittivity of fingers using the waveguide-penetration method
Tomoki Hamaji, Alfred Kik, Takahiro Aoyagi, Atsuhiro Nishikata
IEICE Transactions on Communication   J94-B(11) 1503-1507   Nov 2011   [Refereed]
We measured equivalent complex permittivity of fingers of five persons totaling to 14 fingers in vivo in 750-1150 MHz by using the waveguide-penetration method. Real part of measured value was 37.1±4.4 and its imaginary part was 11.8±1.2 (average ...
Alfred Kik, Atsuhiro Nishikata
IEICE Transactions on Communication   94-B(9) 2549-2557   Sep 2011   [Refereed]
The waveguide-penetration method is a method to measure the electrical properties of materials. In this method, a cylindrical object pierces a rectangular waveguide through a pair of holes at the centre of its broad walls. Then, the complex permit...
Alfred Kik, Atsuhiro Nishikata
IEICE Transactions on Communication   93-B(7) 1697-1706   Jul 2010   [Refereed]
The Waveguide-Penetration method is a permittivity measurement technique where a columnar object pierces a rectangular waveguide through a pair of holes at the center of its broad walls. The permittivity of the object is estimated from measured S-...
Camillo Gentile, Sofia Martinez Lopez, Alfred Kik
IEEE Transaction on Antennas and Propagation   58(6) 2069-2077   Jun 2010   [Refereed]
Despite the potential for high-speed communications, stringent regulatory mandates on ultrawideband (UWB) emission have hindered its commercial success. By combining resolvable UWB multipath from different directions, multiple-input multiple-outpu...
Gentile Camillo, Kik Alfred
IEEE Transaction on Antennas and Propagation   56(8-2) 2775-2780   Aug 2008   [Refereed]
While the frequency dependence of the wireless channel may be negligible for narrow to wideband signals, it has been shown that modeling this dependence for bandwidths in excess of 2 GHz improves channel reconstruction up to 40%. Yet to our knowle...
Camillo Gentile, A. Judson Braga, Alfred Kik
EURASIP J. Wireless Comm. and Networking   2008    2008   [Refereed]
Fine time resolution enables ultrawideband (UWB) ranging systems to extract the first multipath arrival corresponding to the range between a transmitter and receiver, even when attenuated in strength compared to later arrivals. Bearing systems alo...
Camillo Gentile, Alfred Kik
EURASIP J. Wireless Comm. and Networking   2007    2007   [Refereed]
Ultra-wideband technology shows promise for precision ranging due to its fine time resolution to resolve multipath fading and the presence of lower frequencies in the baseband to penetrate walls. While a concerted effort has been conducted in the ...