KOBAYASHI Daisuke

J-GLOBAL         Last updated: Jan 29, 2019 at 09:59
 
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Name
KOBAYASHI Daisuke
E-mail
d.kobayashiisas.jaxa.jp
Affiliation
Japan Aerospace Exploration Agency
Section
Institute of Space and Astronautical Science
Job title
Assistant Professor
Degree
D.S.(The University of Tokyo)
ORCID ID
0000-0002-0140-8820

Profile

Our daily life relies on computers and their computation units of computer chips. We usually have an impression that they are always correct and reliable, but do you know this impression is a result of many researchers' efforts? Researchers are working for making computer chips tough against sudden shocks, and otherwise the chips can be easily surprised and lose their memory. This memory loss phenomenon is technically called "soft errors" and "single-event upsets", but rather than those technical terms I'd prefer to say simply, "computers can be surprised", which brings a clear image into mind. What makes them surprised? We can find it in some places including twinkle stars in space. From the stars invisible high-energy fragments come and travel in space; some of them arrive at the ground. They can give a shock to computer chips---an electric shock it is literally. Researchers are working for countermeasures against the shock in order to make computer chips be entrusted. Communicating with each other, some researchers are working for mainly how to protect the chips on the ground and others for the chips in space. I'm working for the latter, for the use in space, as a member of the Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency. For the successful use of computer chips in space, we have other issues to be solved; computers can be tired! I'd collectively call them space-chip engineering, which is my current research topic.

Research Areas

 
 

Academic & Professional Experience

 
2005
 - 
Today
Assistant Professor, ISAS/JAXA
 
 
   
 
During this period, I held the following additional posts
 
Jul 2017
 - 
Today
Research Unit I, JAXA
 
Apr 2011
 - 
Today
Assistant Professor, The University of Tokyo
 
Oct 2006
 - 
Mar 2011
Assistant Professor, The Graduate University for Advanced Studies
 
Dec 2009
 - 
Nov 2010
Visiting researcher, imec
 

Committee Memberships

 
2013
 - 
Today
S&T Experts Network  Member
 
2015
 - 
2017
IEEE Transactions on Nuclear Science  Associate editor
 

Awards & Honors

 
2015
ISAS Director-General Award, ISAS/JAXA
Winner: Co-recipient, as a member of the PROCYON team
 
2011
Space Science Award for Young Scientists, Society for Promotion of Space Science
Winner: Daisuke Kobayashi
 
2010
RASEDA-9 Best Poster Award
Winner: Co-recipient, as a co-author
 
2009
Incentive Award for Excellent presentation, Japan Society of Applied Physics
Winner: Daisuke Kobayashi
 
2002
Japan Chapter Student Award, IEEE Electron Devices Society Japan Chapter
Winner: Daisuke Kobayashi
 

Published Papers

 
Only journal papers are listed here and conference papers are elsewhere
D. Kobayashi, N. Hayashi, K. Hirose, Y. Kakehashi, O. Kawasaki, T. Makino, T. Ohshima, D. Matsuura, Y. Mori, M. Kusano, T. Narita, S. Ishii, and K. Masukawa
IEEE Transactions on Nuclear Science   66(1) 155-162   Jan 2019   [Refereed]
C.-H. Chung, D. Kobayashi, and K. Hirose
IEEE Transactions on Device and Materials Reliability   18(4) 574-582   Dec 2018   [Refereed]
T. Kato, T. Yamazaki, K. Maruyama, and T. Soeda, H. Itsuji, D. Kobayashi, K. Hirose, H. Matsuyama
IEEE Transactions on Nuclear Science   65(8) 1900-1907   Aug 2018   [Refereed]
H. Itsuji, D. Kobayashi, O. Kawasaki, D. Matsuura, T. Narita, M. Kato, S. Ishii, K. Masukawa, and K. Hirose
IEEE Transactions on Nuclear Science   65(1) 346-353   Jan 2018   [Refereed]
D. Kobayashi, K. Hirose, T. Makino, S. Onoda, T. Ohshima, S. Ikeda, H. Sato, E.C.I. Enobio, T. Endoh, and H. Ohno
Japanese Journal of Applied Physics   56(8) 0802B4   Aug 2017   [Refereed]
D. Kobayashi, K. Hirose, T. Ito, Y. Kakehashi, O. Kawasaki, T. Makino, T. Ohshima, D. Matsuura, T. Narita, M. Kato, S. Ishii, and K. Masukawa
IEEE Transactions on Nuclear Science   65(1) 523-532   Jan 2018   [Refereed]
K. Yamaguchi, D. Kobayashi, T. Yamamoto, and K. Hirose
Physica B   532 99-102   Mar 2018   [Refereed]
K. Hirose, D. Kobayashi, T. Ito, and T. Endoh
Japanese Journal of Applied Physics   56(8) 0802A5   Aug 2017   [Refereed]
Y. Narita, Y. Takahashi, M. Harada, K. Oikawa, D. Kobayashi, K. Hirose, H. Sato, S. Ikeda, T. Endoh, H. Ohno
Japanese Journal of Applied Physics   56(8) 0802B3   Aug 2017   [Refereed]
H. Itsuji, D. Kobayashi, N. E. Lourenco, and K. Hirose
Japanese Journal of Applied Physics   56(45) 04CD16   Apr 2017   [Refereed]
K. Motoki,Y. Miyazawa, D. Kobayashi, M. Ikegami, T. Miyasaka, T. Yamamoto, and K. Hirose
Journal of Applied Physics   121 085501   Feb 2017   [Refereed]
N. E. Lourenco, Z. E. Fleetwood, A. Ildefonso, M. T. Wachter, N. J.-H. Roche, A. Khachatrian, D. McMorrow, S. P. Buchner, J. H. Warner, H. Itsuji, D. Kobayashi, K. Hirose, P. Paki, A. Raman, and J. D. Cressler
IEEE Transactions on Nuclear Science   64(1) 406-414   Jan 2017   [Refereed]
D. Kobayashi, Y. Kakehashi, K. Hirose, S. Onoda, T. Makino, T. Ohshima, S. Ikeda, M. Yamanouchi, H. Sato, E.-C. Enobio, T. Endoh, and H. Ohno
IEEE Transactions on Nuclear Science   62(4) 1710-1716   Aug 2014   [Refereed]
D. Kobayashi, E. Simoen, S. Put, A. Griffoni, M. Poizat, K. Hirose, and C. Claeys
IEEE Transactions on Nuclear Science   58(3) 800-807   Jun 2011   [Refereed]
P. G. D. Agopian and J. A. Martino, D. Kobayashi, E. Simoen, and C. Claeys
IEEE Transactions on Nuclear Science   59(4) 707-713   Aug 2012   [Refereed]
H. Seki, Y. Shibuya, D. Kobayashi, H. Nohira, K. Yasuoka, and K. Hirose
Japanese Journal of Applied Physics   51(4) 04DA07   Apr 2012   [Refereed]
A. Luque Rodr ́ıguez, M. Bargallo Gonzalez, G. Eneman, C. Claeys, D. Kobayashi, and E. Simoen
IEEE Transactions on Electron Devices   58(8) 2362-2370   Aug 2011   [Refereed]
Y. Arai, T. Miyoshi, Y. Unno, T. Tsuboyama, S. Terada, Y. Ikegami, R. Ichimiya, T. Kohriki, K. Tauchi, Y. Ikemoto, Y. Fujita, T. Uchida, K. Hara, H. Miyake, M. Kochiyama, T. Sega, K. Hanagaki, M. Hirose, J. Uchida, Y. Onuki, Y. Horii, H. Yamamoto, T. Tsuru, H. Matsumoto, S. G. Ryu, R. Takashima, A. Takeda, H. Ikeda, D. Kobayashi, T. Wada, H. Nagata, T. Hatsui, T. Kudo, A. Taketani, T. Kameshima, T. Hirono, M. Yabashi, Y. Furukawa, M. Battaglia, P. Denes, C. Vu, D. Contarato, P. Giubilato T. S. Kim, M. Ohno, K. Fukuda, I. Kurachi, M. Okihara, N. Kuriyama, M. Motoyoshi
Nuclear Instruments and Methods in Physics Research A   636(1) S31-S36   Apr 2011   [Refereed]
E. Simoen, G. Eneman, M. Bargallo Gonzalez, D. Kobayashi, A. Luque Rodr ́ıguez, J.-A. Jime ́nez Tejada and C. Claeys
Journal of The Electrochemical Society   158(5) R27-R36   Mar 2011   [Refereed]
Y. ito, K. Akimoto, H. Yoshida, T. Emoto, D. Kobayashi, and K. Hirose
Journal of Physics: Conference Series   83 012011   2007   [Refereed]
V. Ferlet-Cavrois, D. Kobayashi, D. McMorrow, J. R. Schwank, H. Ikeda, A. Zadeh, O. Flament, and K. Hirose
IEEE Transactions on Nuclear Science   57(4) 1811-1819   Aug 2010   [Refereed]
T. Makino, D. Kobayashi, K. Hirose, Y. Yanagawa, H. Saito, H. Ikeda, D. Takahashi, S. Ishii, M. Kusano, S. Onoda, T. Hirao, and T. Ohshima
IEEE Transactions on Nuclear Science   56(6) 3180-3184   Dec 2009   [Refereed]
D. Kobayashi, K. Hirose, V. Ferlet-Cavrois, D. McMorrow, T. Makino, H. Ikeda, Y. Arai, and M. Ohno
IEEE Transactions on Nuclear Science   56(6) 3043-3049   Dec 2009   [Refereed]
Y. Yanagawa, D. Kobayashi, K. Hirose, T. Makino, H. Saito, H. Ikeda, S. Onoda, T. Hirao, and T. Ohshima
IEEE Transactions on Nuclear Science   56(4) 1958-1963   Aug 2009   [Refereed]
V. Ferlet-Cavrois, D. McMorrow, D. Kobayashi, N. Fel, J. S. Melinger, P. Paillet, V. Pouget, F. Essely, J. Baggio, S. Girard, R. S. Flores, J. R. Schwank, P. E. Dodd, M. R. Shaneyfelt, K. Hirose, and H. Sait
IEEE Transactions on Nuclear Science   56(4) 2014-2020   Aug 2009   [Refereed]
T. Makino, D. Kobayashi, K. Hirose, Y. Yanagawa, H. Saito, H. Ikeda, D. Takahashi, S. Ishii, M. Kusano, S. Onoda, T. Hirao, and T. Ohshima
IEEE Transactions on Nuclear Science   56(1) 202-207   Feb 2009   [Refereed]
D. Kobayashi, K. Hirose, Y. Yanagawa, H. Ikeda, H. Saito, V. Ferlet-Cavrois, D. McMorrow, M. Gaillardin, P. Paillet, Y. Arai, and M. Ohno
IEEE Transactions on Nuclear Science   55(6) 2872-2879   Dec 2008   [Refereed]
V. Ferlet-Cavrois, V. Pouget, D. McMorrow, J. R. Schwank, N. Fel, F. Essely, R. S. Flores, P. Paillet, M. Gaillardin, D. Kobayashi, J. S. Melinger, O. Duhamel, P. E. Dodd, and M. R. Shaneyfelt
IEEE Transactions on Nuclear Science   55(6) 2842-2853   Dec 2008   [Refereed]
K. Hirose, D. Kobayashi, H. Suzuki, and H. Nohira
Applied Physics Letters   93(19) 193503   Nov 2008   [Refereed]
Y. Yanagawa, D. Kobayashi, H. Ikeda, H. Saito, and K. Hirose
IEEE Transactions on Nuclear Science   55(5) 1947-1952   Aug 2008   [Refereed]
D. Kobayashi, K. Hirose, T. Makino, H. Ikeda, and H. Saito
IEEE Transactions on Nuclear Science   54(6) 2347-2354   Dec 2007   [Refereed]
D. Kobayashi, H. Saito, and K. Hirose
IEEE Transac- tions on Nuclear Science   54(4) 1037-1041   Aug 2007   [Refereed]
D. Kobayashi, M. Aimi, H. Saito, and K. Hirose
IEEE Transactions on Nuclear Science   53(6) 3372-3378   Dec 2006   [Refereed]
Y. Yanagawa, K. Hirose, H. Saito, D. Kobayashi, S. Fukuda, S. Ishii, D. Takahashi, K. Yamamoto, and Y. Kuroda
IEEE Transactions on Nuclear Science   53(6) 3575-3578   Dec 2006   [Refereed]
K. Hirose, M. Kihara, D. Kobayashi, H. Okamoto, S. Shinagawa, H. Nohira, E. Ikenaga, M. Higuchi, A. Teramoto, S. Sugawa, T. Ohomi, and T. Hattori
Applied Physics Letters   89(15) 154103   Oct 2006   [Refereed]
D. Kobayashi, T. Shibata, Y. Fujimori, T. Nakamura, and H. Takasu
IEEE Transactions on Electron Devices   52(10) 2188-2197   Oct 2005   [Refereed]
D. Kobayashi, Y. Mita, T. Shibata, T. Bourouina, and H. Fujita
Journal of Micromechanics and Microengineering   14(9) S76-S81   Sep 2004   [Refereed]

Conference Activities & Talks

 
Listed here are only refereed international conference papers including invited talks.
Process variation aware analysis of SRAM SEU cross-sections using data retention voltage
D. Kobayashi, N. Hayashi, K. Hirose, Y. Kakehashi, O. Kawasaki, T. Makino, T. Ohshima, D. Matsuura, Y. Mori, M. Kusano, T. Narita, S. Ishii, and K. Masukawa
IEEE Nuclear and Space Radiation Effects Conference (NSREC)   16 Jul 2018   
paper C-3 (Refereed)
Threshold ion parameters of line-type soft-errors in biased thin-BOX SOI SRAMs: difference between sensitivities to terrestrial and space radiation
C.-H. Chung, D. Kobayashi, and K. Hirose
IEEE International Reliability Physics Symposium (IRPS)   11 May 2018   
paper 4C.3 (Refereed)
X-ray photoelectron study on reliability of advanced MOSFETs [Invited]
K. Hirose and D. Kobayashi
7th Int. Conf. Electronics, Communications and Networks (CECNet)   24 Nov 2017   
paper CNT2228
Effects of SiH groups on ELDRS quantified with a combined use of X-ray, gamma-ray, and electron-beam irradiation
S. Toguchi, D. Kobayashi, T. Makino, T. Ohshima, and K. Hirose
Conference on Radiation Effects on Components and Systems (RADECS)   2 Oct 2017   
paper C-2 (refereed)
selected as a recipient of RADECS Student Godfather- ship support

Research Grants & Projects

 
XPS study on ultra thin SiO2 film formed on Si substrates with several surface orientations
Grant-in-Aid for Scientific Research (C)
Project Year: 2014 - 2016    Investigator(s): Daisuke Kobayashi
Co-investigator
Radiation-induced increase in local temperature and its effects on soft error tolerance
Grant-in-Aid for Scientific Research (C)
Project Year: 2012 - 2015    Investigator(s): Daisuke Kobayashi
Principal investigator
Study on dielectric constant of ultrathin SiO2 by using XPS and first-principles calculation
Grant-in-Aid for Scientific Research (B)
Project Year: 2009 - 2011    Investigator(s): Daisuke Kobayashi
Co-Investigator
Experimental waveform study of SET pulses leading to soft errors in logic LSI
Grant-in-Aid for Young Scientists (B)
Project Year: 2008 - 2009    Investigator(s): Daisuke Kobayashi
Principal investigator
LSI test technology for evaluating soft-error-rates in combinational logic circuits
Grant-in-Aid for Scientific Research (C)
Project Year: 2006 - 2007    Investigator(s): Daisuke Kobayashi
Principal investigator