2015年6月
Hard x-ray photoelectron spectroscopy using an environmental cell with silicon nitride membrane windows
JOURNAL OF APPLIED PHYSICS
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- 巻
- 117
- 号
- 23
- 開始ページ
- 234902
- 終了ページ
- 記述言語
- 英語
- 掲載種別
- 研究論文(学術雑誌)
- DOI
- 10.1063/1.4922335
- 出版者・発行元
- AMER INST PHYSICS
We applied hard x-ray photoelectron spectroscopy (HAXPES) to a sample under ambient pressure conditions using an environmental cell with an approximately 24 nm-thick SiNx membrane window. As a model chemical substance, europium (II) iodide (EuI2) sealed in the cell with argon gas was investigated with HAXPES to identify the chemical species present inside the cell. The optical and morphological properties of the sample within the cell were measured with optical and fluorescent microscopy, scanning electron microscopy, cathodoluminescence, and energy dispersive x-ray spectrometry. We confirmed the effectiveness of the gas barrier properties of the cell with the SiNx window and demonstrated its applicability to various other optical and electron measurements as well as HAXPES. (C) 2015 AIP Publishing LLC.
- リンク情報
- ID情報
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- DOI : 10.1063/1.4922335
- ISSN : 0021-8979
- eISSN : 1089-7550
- Web of Science ID : WOS:000356619300026