論文

査読有り
2015年6月

Hard x-ray photoelectron spectroscopy using an environmental cell with silicon nitride membrane windows

JOURNAL OF APPLIED PHYSICS
  • Eika Tsunemi
  • ,
  • Yoshio Watanabe
  • ,
  • Hiroshi Oji
  • ,
  • Yi-Tao Cui
  • ,
  • Jin-Young Son
  • ,
  • Atsushi Nakajima

117
23
開始ページ
234902
終了ページ
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1063/1.4922335
出版者・発行元
AMER INST PHYSICS

We applied hard x-ray photoelectron spectroscopy (HAXPES) to a sample under ambient pressure conditions using an environmental cell with an approximately 24 nm-thick SiNx membrane window. As a model chemical substance, europium (II) iodide (EuI2) sealed in the cell with argon gas was investigated with HAXPES to identify the chemical species present inside the cell. The optical and morphological properties of the sample within the cell were measured with optical and fluorescent microscopy, scanning electron microscopy, cathodoluminescence, and energy dispersive x-ray spectrometry. We confirmed the effectiveness of the gas barrier properties of the cell with the SiNx window and demonstrated its applicability to various other optical and electron measurements as well as HAXPES. (C) 2015 AIP Publishing LLC.

リンク情報
DOI
https://doi.org/10.1063/1.4922335
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000356619300026&DestApp=WOS_CPL
ID情報
  • DOI : 10.1063/1.4922335
  • ISSN : 0021-8979
  • eISSN : 1089-7550
  • Web of Science ID : WOS:000356619300026

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