論文

査読有り
2005年12月

High-dimensional and large-scale phenotyping of yeast mutants

PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA
  • Y Ohya
  • J Sese
  • M Yukawa
  • F Sano
  • Y Nakatani
  • TL Saito
  • A Saka
  • T Fukuda
  • S Ishihara
  • S Oka
  • G Suzuki
  • M Watanabe
  • A Hirata
  • M Ohtani
  • H Sawai
  • N Fraysse
  • JP Latge
  • JM Francois
  • M Aebi
  • S Tanaka
  • S Muramatsu
  • H Araki
  • K Sonoike
  • S Nogami
  • S Morishita
  • 全て表示

102
52
開始ページ
19015
終了ページ
19020
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1073/pnas.0509436102
出版者・発行元
NATL ACAD SCIENCES

One of the most powerful techniques for attributing functions to genes in uni- and multicellular organisms is comprehensive analysis of mutant traits. In this study, systematic and quantitative analyses of mutant traits are achieved in the budding yeast Saccharomyces cerevisiae by investigating morphological phenotypes. Analysis of fluorescent microscopic images of triple-stained cells makes it possible to treat morphological variations as quantitative traits. Deletion of nearly half of the yeast genes not essential for growth affects these morphological traits. Similar morphological phenotypes are caused by deletions of functionally related genes, enabling a functional assignment of a locus to a specific cellular pathway. The high-dimensional phenotypic analysis of defined yeast mutant strains provides another step toward attributing gene function to all of the genes in the yeast genome.

リンク情報
DOI
https://doi.org/10.1073/pnas.0509436102
PubMed
https://www.ncbi.nlm.nih.gov/pubmed/16365294
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000234350000043&DestApp=WOS_CPL
ID情報
  • DOI : 10.1073/pnas.0509436102
  • ISSN : 0027-8424
  • PubMed ID : 16365294
  • Web of Science ID : WOS:000234350000043

エクスポート
BibTeX RIS