論文

査読有り
2015年12月13日

Discriminative Learning of Deep Convolutional Feature Point Descriptors

International Conference on Computer Vision (ICCV)
  • Edgar Simo-Serra
  • ,
  • Eduard Trulls
  • ,
  • Luis Ferraz
  • ,
  • Iasonas Kokkinos
  • ,
  • Pascal Fua
  • ,
  • Francesc Moreno-Noguer

2015
開始ページ
118
終了ページ
126
記述言語
英語
掲載種別
研究論文(国際会議プロシーディングス)
DOI
10.1109/ICCV.2015.22
出版者・発行元
Institute of Electrical and Electronics Engineers Inc.

Deep learning has revolutionalized image-level tasks such as classification, but patch-level tasks, such as correspondence, still rely on hand-crafted features, e.g. SIFT. In this paper we use Convolutional Neural Networks (CNNs) to learn discriminant patch representations and in particular train a Siamese network with pairs of (non-)corresponding patches. We deal with the large number of potential pairs with the combination of a stochastic sampling of the training set and an aggressive mining strategy biased towards patches that are hard to classify. By using the L2 distance during both training and testing we develop 128-D descriptors whose euclidean distances reflect patch similarity, and which can be used as a drop-in replacement for any task involving SIFT. We demonstrate consistent performance gains over the state of the art, and generalize well against scaling and rotation, perspective transformation, non-rigid deformation, and illumination changes. Our descriptors are efficient to compute and amenable to modern GPUs, and are publicly available.

リンク情報
DOI
https://doi.org/10.1109/ICCV.2015.22
ID情報
  • DOI : 10.1109/ICCV.2015.22
  • ISSN : 1550-5499
  • SCOPUS ID : 84973915418

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