村木直樹 (Naoki Muraki) - マイポータル

基本情報

所属: 株式会社東レリサーチセンター

学位: 博士（工学）(京都工芸繊維大学)
修士（理学）(京都大学)

研究者番号: 40716297
J-GLOBAL ID: 202001018898647946
researchmap会員ID: R000012344

研究分野

受賞

1996年

JCerSJ優秀論文賞, セラミック基ナノ複合材料における残留応力と擬強化（英文）, 日本セラミックス協会

Giuseppe Pezzotti・Valter Sergo, 太田健一, Orfeo Sbaizero, 村木直樹, 西田俊彦, 逆井基次, University of Trieste, 大阪大学産業科学研究所, 株, 東レリサーチセンター

論文

Study of oxygenation and hydrogenation of tris(8-hydroxyquinoline) aluminum generated by electrode deposition using liquid extraction surface analysis nanoelectrospray ionization mass spectrometry

Naoki Muraki, Hikaru Takano, Tsuyoshi Akiyama

Chemical Physics Letters 756 2020年10月査読有り
New method for chemical characterization of polymer materials in industrial devices : AFM-IR with FIB sample preparation

Naoki Baden, Mitsunobu Yasuda, Akiyo Yoshida, Naoki Muraki

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2015-August 496-499 2015年8月25日査読有り
In situ monitoring of thermal crystallization of ultrathin tris(8-hydroxyquinoline) aluminum films using surface-enhanced raman scattering

Naoki Muraki

Applied Spectroscopy 68(1) 39-43 2014年1月査読有り
Thermal stability and kinetics of delithiated LiCoO<inf>2</inf>

Yoshitomo Furushima, Chika Yanagisawa, Takeshi Nakagawa, Yasuhito Aoki, Naoki Muraki

Journal of Power Sources 196(4) 2260-2263 2011年2月15日査読有り
Depth profile analysis of organic multi-layer device with nanometer resolution using surface-enhanced Raman spectroscopy

Naoki Muraki, Takashi Miyamoto, Masanobu Yoshikawa

Chemical Physics Letters 499(1-3) 158-160 2010年10月20日査読有り
Characterization of the interface between metal and tris (8-hydroxyquinoline) aluminum using surface-enhanced Raman scattering with glass cap encapsulation

Naoki Muraki, Masanobu Yoshikawa

Chemical Physics Letters 496(1-3) 91-94 2010年8月20日査読有り
Polarized micro-Raman measurements of cross sections of single- and multi-layer organic films on glass substrate

Naoki Muraki, Masanobu Yoshikawa

Chemical Physics Letters 481(1-3) 103-106 2009年査読有り
Chirped coherent anti-Stokes Raman scattering as a high-spectral- and spatial-resolution microscopy

Robert M. Onorato, Naoki Muraki, Kelly P. Knutsen, Richard J. Saykally

Optics Letters 32(19) 2858-2860 2007年10月1日査読有り
Residual Stress Mapping of Epoxy Molding Compound in a Ball Grid Array Microelectronic Package Using a Fluorescent Sensor

Naoki Muraki, Nobuhiro Matoba, Takayuki Hirano, Masanobu Yoshikawa, Giuseppe Pezzotti

Applied Spectroscopy 58(2) 152-159 2004年2月査読有り
Determination of thermal stress distribution in a model microelectronic device encapsulated with alumina filled epoxy resin using fluorescence spectroscopy

N. Muraki, N. Matoba, T. Hirano, M. Yoshikawa

Polymer 43(4) 1277-1285 2001年12月10日査読有り
Relationship between graded layer structures and defects in silicon-germanium virtual substrates

Kazuki Mizushima, Ichiro Shiono, Kenji Yamaguchi, Naoki Muraki

Materials Research Society Symposium - Proceedings 648 P1111-P1116 2001年査読有り
Effect of grain morphology on fracture behavior of alumina ceramics analyzed by in situ fluorescence microprobe spectroscopy

Hajime Okuda, Giuseppe Pezzotti, Naoki Muraki, Toshihiko Nishida

Zairyo/Journal of the Society of Materials Science, Japan 48(9) 1041-1046 1999年9月査読有り
In-Situ Determination of bridging stresses in Al<inf>2</inf>O<inf>3</inf>/Al<inf>2</inf>O<inf>3</inf>-platelet composites by fluorescence spectroscopy

Giuseppe Pezzotti, Hajime Okuda, Naoki Muraki, Toshihiko Nishida

Journal of the European Ceramic Society 19(5) 601-608 1999年5月査読有り
Strengthening contribution arising from residual stresses in Al<inf>2</inf>O<inf>3</inf>/ZrO<inf>2</inf> composites: A piezo-Spectroscopy investigation

Giuseppe Pezzotti, Valter Sergo, Orfeo Sbaizero, Naoki Muraki, Sergio Meriani, Toshihiko Nishida

Journal of the European Ceramic Society 19(2) 247-253 1999年2月査読有り
Effect of interface chemistry on the mechanical properties of Si<inf>3</inf>N<inf>4</inf>-matrix composites

G. Pezzotti, T. Nishida, H. J. Kleebe, K. Ota, N. Muraki, V. Sergo

Journal of Materials Science 34(7) 1667-1680 1999年査読有り
In situ measurement of bridging stresses in toughened silicon nitride using raman microprobe spectroscopy

Giuseppe Pezzotti, Naoki Muraki, Naoki Maeda, Kouji Satou, Toshihiko Nishida

Journal of the American Ceramic Society 82(5) 1249-1256 1999年査読有り
Probing fracture of silicon nitride by in situ microscopic raman spectroscopy

Giuseppe Pezzotti, Naoki Muraki, Toshihiko Nishida

Journal of the Ceramic Society of Japan 106(8) 768-771 1998年8月査読有り
The effect of wear on the tetragonal-to-monoclinic transformation and the residual stress distribution in zirconia-toughened alumina cutting tools

Valter Sergo, Vanni Lughi, Giuseppe Pezzotti, Elio Lucchini, Sergio Meriani, Naoki Muraki, Gen Katagiri, Salvatore Lo Casto, Toshihiko Nishida

Wear 214(2) 264-270 1998年2月査読有り
In situ measurements of frictional bridging stresses in alumina using fluorescence spectroscopy

Giuseppe Pezzotti, Orfeo Sbaizero, Valter Sergo, Naoki Muraki, Ken Maruyama, Toshihiko Nishida

Journal of the American Ceramic Society 81(1) 187-192 1998年1月査読有り
Raman piezo-spectroscopic behavior of aluminum nitride

Naoki Muraki, Valter Sergo, Giuseppe Pezzotti, Gen Katagiri, Sergio Meriani, Toshihiko Nishida

Applied Spectroscopy 51(11) 1761-1765 1997年11月

もっとみる

所属学協会

2006年 - 現在

日本分光学会
2006年 - 現在

高分子学会