論文

査読有り
2017年7月

Pathogenic variation of South American Phakopsora pachyrhizi populations isolated from soybeans from 2010 to 2015

Japan Agricultural Research Quarterly
  • Akamatsu, H
  • ,
  • Yamanaka, N
  • ,
  • Soares, R. M
  • ,
  • Ivancovich, A. J. G
  • ,
  • Lavilla, M. A
  • ,
  • Bogado, A. N
  • ,
  • Morel, G
  • ,
  • Scholz, R
  • ,
  • Yamaoka, Y
  • ,
  • Kato, M

51
3
開始ページ
221
終了ページ
232
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.6090/jarq.51.221
出版者・発行元
JAPAN INT RESEARCH CENTER AGRICULTURAL SCIENCES

Soybean rust caused by Phakopsora pachyrhizi is one of the most serious economic threats to soybean production in South America. A previous study using South American P. pachyrhizi populations collected between 2007/2008 and 2009/2010 revealed the pathogenic diversity in Argentinean, Brazilian, and Paraguayan rust populations. Because such pathogenic diversity has been a major constraint to the breeding program for soybean rust resistance, pathogen populations were continuously monitored throughout the 2010/2011 to 2014/2015 seasons using the same method of evaluating pathogenicity as used in the previous study. None of the 83 P. pachyrhizi samples collected from the three countries from 2010/2011 to 2014/2015 yielded identical pathogenicity patterns in the 16 differentials, thus demonstrating the pathogenic diversity of more recent South American rust populations. Cluster analysis using a total of 145 rust populations from 2007 to 2015 demonstrated that the Argentinean, Brazilian, and Paraguayan populations were not assigned to three distinct country-based groups. The analysis indicated that a majority of South American populations differed in pathogenicity compared with Japanese rust races. The rates of resistance to the rust populations varied among the 13 differentials carrying Rpp genes; the most effective resistance gene was Rpp1-b followed by Rpp5, and the least effective was Rpp1.

Web of Science ® 被引用回数 : 5

リンク情報
DOI
https://doi.org/10.6090/jarq.51.221
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000405774100004&DestApp=WOS_CPL