論文

査読有り
2018年2月15日

Theoretical detection limit of PIXE analysis using 20 MeV proton beams

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
  • Keizo Ishii
  • ,
  • Keitaro Hitomi

417
開始ページ
37
終了ページ
40
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1016/j.nimb.2017.10.008
出版者・発行元
Elsevier B.V.

Particle-induced X-ray emission (PIXE) analysis is usually performed using proton beams with energies in the range 2∼3 MeV because at these energies, the detection limit is low. The detection limit of PIXE analysis depends on the X-ray production cross-section, the continuous background of the PIXE spectrum and the experimental parameters such as the beam currents and the solid angle and detector efficiency of X-ray detector. Though the continuous background increases as the projectile energy increases, the cross-section of the X-ray increases as well. Therefore, the detection limit of high energy proton PIXE is not expected to increase significantly. We calculated the cross sections of continuous X-rays produced in several bremsstrahlung processes and estimated the detection limit of a 20 MeV proton PIXE analysis by modelling the Compton tail of the γ-rays produced in the nuclear reactions, and the escape effect on the secondary electron bremsstrahlung. We found that the Compton tail does not affect the detection limit when a thin X-ray detector is used, but the secondary electron bremsstrahlung escape effect does have an impact. We also confirmed that the detection limit of the PIXE analysis, when used with 4 μm polyethylene backing film and an integrated beam current of 1 μC, is 0.4∼2.0 ppm for proton energies in the range 10∼30 MeV and elements with Z = 16–90. This result demonstrates the usefulness of several 10 MeV cyclotrons for performing PIXE analysis. Cyclotrons with these properties are currently installed in positron emission tomography (PET) centers.

リンク情報
DOI
https://doi.org/10.1016/j.nimb.2017.10.008
ID情報
  • DOI : 10.1016/j.nimb.2017.10.008
  • ISSN : 0168-583X
  • SCOPUS ID : 85041355817

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