Papers

Peer-reviewed
Mar, 2008

Inter-layer screening length to electric field in thin graphite film

APPLIED PHYSICS EXPRESS
  • Hisao Miyazaki
  • ,
  • Shunsuke Odaka
  • ,
  • Takashi Sato
  • ,
  • Sho Tanaka
  • ,
  • Hidenori Goto
  • ,
  • Akinobu Kanda
  • ,
  • Kazuhito Tsukagoshi
  • ,
  • Youiti Ootuka
  • ,
  • Yoshinobu Aoyagi

Volume
1
Number
3
Language
English
Publishing type
Research paper (scientific journal)
DOI
10.1143/APEX.1.034007
Publisher
JAPAN SOC APPLIED PHYSICS

Electric conduction in thin graphite film was tuned by two gate electrodes to clarify how the gate electric field induces electric carriers in thin graphite. The graphite was sandwiched between two gate electrodes arranged in a top and bottom gate configuration. A scan of the top gate voltage generates a resistance peak in ambiploar response. The ambipolar peak is shifted by the bottom gate voltage, where the shift rate depends on the graphite thickness. The thickness-dependent peak shift was clarified in terms of the inter-layer screening length to the electric field in the double-gated graphite film. The screening length of 1.2 nm was experimentally obtained. (C) 2008 The Japan Society of Applied Physics.

Link information
DOI
https://doi.org/10.1143/APEX.1.034007
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000255453000018&DestApp=WOS_CPL
ID information
  • DOI : 10.1143/APEX.1.034007
  • ISSN : 1882-0778
  • eISSN : 1882-0786
  • Web of Science ID : WOS:000255453000018

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