論文

査読有り
2008年8月

A study on electro thermal response of SiC power module during high temperature operation

IEICE ELECTRONICS EXPRESS
  • Tsuyoshi Funaki
  • ,
  • Akira Nishio
  • ,
  • Tsunenobu Kimoto
  • ,
  • Takashi Hikihara

5
16
開始ページ
597
終了ページ
602
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1587/elex.5.597
出版者・発行元
IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG

This paper focuses on using high temperature operating capability of SiC power devices, which are packaged in power modules. A SiC Schottky barrier diode is mounted on an active metal brazed Si3N4 substrate as a heat resistive power module. The temperature dependency of electrical characteristics of the SiC device and thermal dynamics of the power module are modeled for numerical electro thermal analysis. The results of numerical analysis demonstrate high temperature operation of SiC device in the power module, which assumes less heat dissipation by simplified cooling system. The experimental results validate the numerical analysis results of the modeled SiC power module.

リンク情報
DOI
https://doi.org/10.1587/elex.5.597
CiNii Articles
http://ci.nii.ac.jp/naid/130000088295
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000260206600005&DestApp=WOS_CPL
ID情報
  • DOI : 10.1587/elex.5.597
  • ISSN : 1349-2543
  • CiNii Articles ID : 130000088295
  • Web of Science ID : WOS:000260206600005

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