2009年12月1日
Structural characterization and dielectric properties of hexagonal Lu(Fe, Ti)O<inf>3</inf>
Japanese Journal of Applied Physics
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- 巻
- 48
- 号
- 9
- 開始ページ
- 09KB04
- 終了ページ
- 09KB04-3
- 記述言語
- 英語
- 掲載種別
- DOI
- 10.1143/JJAP.48.09KB04
- 出版者・発行元
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physics
We investigated the average crystal structure and microstructures of LuFe0.56Ti0.44O3 by transmission electron microscopy (TEM) in combination with dielectric measurements. In this work, high-quality polycrystalline samples of LuFeM0.56Ti 0.44O3 were successfully synthesized in air by the conventional solid-state reaction. The average crystal structure at room temperature is characterized by a hexagonal structure (space group: P6 3cm). Dielectric measurements revealed that LuFe 0.56Ti0.44O3 shows broad dielectric peaks at approximately 450 and 580K, one of which is considered to originate from the formation of polar domains at the nanometer scale. © 2009 The Japan Society of Applied Physics.
- リンク情報
- ID情報
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- DOI : 10.1143/JJAP.48.09KB04
- ISSN : 0021-4922
- CiNii Articles ID : 150000052913
- CiNii Books ID : AA12295836
- SCOPUS ID : 77952688620