Papers

Peer-reviewed Lead author Corresponding author
2017

Aluminum film thickness dependence of surface plasmon resonance in the Far- and deep-ultraviolet regions

Chemistry Letters
  • Ichiro Tanabe
  • ,
  • Yoshito Y. Tanaka
  • ,
  • Koji Watari
  • ,
  • Taras Hanulia
  • ,
  • Takeyoshi Goto
  • ,
  • Wataru Inami
  • ,
  • Yoshimasa Kawata
  • ,
  • Yukihiro Ozaki

Volume
46
Number
10
First page
1560
Last page
1563
Language
English
Publishing type
Research paper (scientific journal)
DOI
10.1246/cl.170635
Publisher
Chemical Society of Japan

Aluminum film thickness dependence of surface plasmon resonance (SPR) in the far- and deep-ultraviolet regions (170300 nm) was revealed using an attenuated total reflectance spectrometer. In the far-ultraviolet region (&lt
200 nm), films of thicknesses 23 and 9 nm showed strong SPR excitations in air and 1,1,1,3,3,3-hexafluoro-2-propanol, which were reproduced by simulations based on the Fresnel equations, respectively. Therefore, Al-SPR sensors are expected to work both in air and in liquids by controlling the film thickness.

Link information
DOI
https://doi.org/10.1246/cl.170635
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000456323100002&DestApp=WOS_CPL
ID information
  • DOI : 10.1246/cl.170635
  • ISSN : 1348-0715
  • ISSN : 0366-7022
  • ORCID - Put Code : 38138470
  • SCOPUS ID : 85032507598
  • Web of Science ID : WOS:000456323100002

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