2017
Aluminum film thickness dependence of surface plasmon resonance in the Far- and deep-ultraviolet regions
Chemistry Letters
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- Volume
- 46
- Number
- 10
- First page
- 1560
- Last page
- 1563
- Language
- English
- Publishing type
- Research paper (scientific journal)
- DOI
- 10.1246/cl.170635
- Publisher
- Chemical Society of Japan
Aluminum film thickness dependence of surface plasmon resonance (SPR) in the far- and deep-ultraviolet regions (170300 nm) was revealed using an attenuated total reflectance spectrometer. In the far-ultraviolet region (<
200 nm), films of thicknesses 23 and 9 nm showed strong SPR excitations in air and 1,1,1,3,3,3-hexafluoro-2-propanol, which were reproduced by simulations based on the Fresnel equations, respectively. Therefore, Al-SPR sensors are expected to work both in air and in liquids by controlling the film thickness.
200 nm), films of thicknesses 23 and 9 nm showed strong SPR excitations in air and 1,1,1,3,3,3-hexafluoro-2-propanol, which were reproduced by simulations based on the Fresnel equations, respectively. Therefore, Al-SPR sensors are expected to work both in air and in liquids by controlling the film thickness.
- Link information
- ID information
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- DOI : 10.1246/cl.170635
- ISSN : 1348-0715
- ISSN : 0366-7022
- ORCID - Put Code : 38138470
- SCOPUS ID : 85032507598
- Web of Science ID : WOS:000456323100002