論文

査読有り
2010年

Enabling false path identification from RTL for reducing design and test futileness

Proceedings - 5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010
  • Hiroshi Iwata
  • ,
  • Satoshi Ohtake
  • ,
  • Hideo Fujiwara

開始ページ
20
終了ページ
25
記述言語
英語
掲載種別
研究論文(国際会議プロシーディングス)
DOI
10.1109/DELTA.2010.23
出版者・発行元
IEEE Computer Society

Information on false paths is useful for design and test. Since identification of false paths at gate level is hard, several methods using high-level design information have been proposed. These methods are effective only if the correspondence between paths at register transfer level (RTL) and at gate level can be established. Until now, the correspondence has been established only by some restricted logic synthesis. In this paper, we propose a method for mapping RTL false paths to their corresponding gate level paths without such a specific logic synthesis. © 2010 IEEE.

リンク情報
DOI
https://doi.org/10.1109/DELTA.2010.23
DBLP
https://dblp.uni-trier.de/rec/conf/delta/IwataOF10
URL
http://doi.ieeecomputersociety.org/10.1109/DELTA.2010.23
URL
http://dblp.uni-trier.de/db/conf/delta/delta2010.html#conf/delta/IwataOF10
ID情報
  • DOI : 10.1109/DELTA.2010.23
  • DBLP ID : conf/delta/IwataOF10
  • SCOPUS ID : 77952329310

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