2010年
Test pattern selection to optimize delay test quality with a limited size of test set
2010 15th IEEE European Test Symposium, ETS'10
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- 開始ページ
- 260
- 終了ページ
- 記述言語
- 英語
- 掲載種別
- 研究論文（国際会議プロシーディングス）
- DOI
- 10.1109/ETSYM.2010.5512733
- 出版者・発行元
- IEEE Computer Society
Timing-aware ATPGs are being developed to detect small delay faults for high defect coverage for current nanometer VLSI design. However, it results in a large test set compared with test generation targeting traditional fault models. This paper proposes a method to get a limited size of test set with high delay test quality based on statistical delay quality level (SDQL). © 2010 IEEE.
- リンク情報
- ID情報
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- DOI : 10.1109/ETSYM.2010.5512733
- DBLP ID : conf/ets/InoueTYIF10
- SCOPUS ID : 78049251918