論文

査読有り 筆頭著者 責任著者
2016年1月

Efficient Scattering Analysis of Arbitrarily Shaped Local Defect in Diffraction Grating

IEICE TRANSACTIONS ON ELECTRONICS
  • Jun-ichiro Sugisaka
  • ,
  • Takashi Yasui
  • ,
  • Koichi Hirayama

E99C
1
開始ページ
76
終了ページ
80
記述言語
英語
掲載種別
研究論文(学術雑誌)
DOI
10.1587/transele.E99.C.76
出版者・発行元
IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG

We propose an algorithm for the scattering analyses of gratings with various local defects based on the difference-field boundary-element method (DFBEM). In the algorithm, the defect in the grating is partitioned, and the DFBEM is sequentially applied for each defect section. We validate the proposed algorithm by demonstrating its flexibility for various defect topologies for a locally deformed grating.

リンク情報
DOI
https://doi.org/10.1587/transele.E99.C.76
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000370389800012&DestApp=WOS_CPL
ID情報
  • DOI : 10.1587/transele.E99.C.76
  • ISSN : 1745-1353
  • Web of Science ID : WOS:000370389800012

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