MISC

査読有り
1998年

Molecular dynamics simulation of fullerene cluster ion impact

ATOMISTIC MECHANISMS IN BEAM SYNTHESIS AND IRRADIATION OF MATERIALS
  • T Aoki
  • ,
  • T Seki
  • ,
  • M Tanomura
  • ,
  • J Matsuo
  • ,
  • Z Insepov
  • ,
  • Yamada, I

504
開始ページ
81
終了ページ
86
記述言語
英語
掲載種別
出版者・発行元
MATERIALS RESEARCH SOCIETY

In order to interpret the projection range and to reveal the mechanism of damage formation by cluster ion impact, molecular dynamics simulations of a fullerene carbon cluster (C-60) impacting on diamond (001) surfaces were performed. When the kinetic energy of C-60 is as low as 200eV/atom, C-60 implants into the substrate deeper than a monomer ion with the same energy per atom because of the clearing-way effect. The kinetic energy of the cluster disperses isotropically because of the multiple-collision effect, and then a large hemispherical damage region is formed. When the energy of the cluster is as high as 2keV/atom, the cluster dissociates in the substrate, and then cascade damage is formed Like in a case of a monomer ion impact. The projection range of incident atoms becomes similar to that of the monomer with the same energy per atom. However, the number of displacements of C-60 is larger than the summation of 60 monomer carbons. The displacement yield of fullerene is 4 to 7 times higher than that of monomer carbon. This result agrees with the measurement of the displacements made on sapphire substrates with C-60 and C-2 irradiation.

リンク情報
Web of Science
https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=JSTA_CEL&SrcApp=J_Gate_JST&DestLinkType=FullRecord&KeyUT=WOS:000079427800012&DestApp=WOS_CPL
ID情報
  • ISSN : 0272-9172
  • Web of Science ID : WOS:000079427800012

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