1998年
Molecular dynamics simulation of fullerene cluster ion impact
ATOMISTIC MECHANISMS IN BEAM SYNTHESIS AND IRRADIATION OF MATERIALS
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- 巻
- 504
- 号
- 開始ページ
- 81
- 終了ページ
- 86
- 記述言語
- 英語
- 掲載種別
- 出版者・発行元
- MATERIALS RESEARCH SOCIETY
In order to interpret the projection range and to reveal the mechanism of damage formation by cluster ion impact, molecular dynamics simulations of a fullerene carbon cluster (C-60) impacting on diamond (001) surfaces were performed. When the kinetic energy of C-60 is as low as 200eV/atom, C-60 implants into the substrate deeper than a monomer ion with the same energy per atom because of the clearing-way effect. The kinetic energy of the cluster disperses isotropically because of the multiple-collision effect, and then a large hemispherical damage region is formed. When the energy of the cluster is as high as 2keV/atom, the cluster dissociates in the substrate, and then cascade damage is formed Like in a case of a monomer ion impact. The projection range of incident atoms becomes similar to that of the monomer with the same energy per atom. However, the number of displacements of C-60 is larger than the summation of 60 monomer carbons. The displacement yield of fullerene is 4 to 7 times higher than that of monomer carbon. This result agrees with the measurement of the displacements made on sapphire substrates with C-60 and C-2 irradiation.
- リンク情報
- ID情報
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- ISSN : 0272-9172
- Web of Science ID : WOS:000079427800012